{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T15:05:24Z","timestamp":1730214324445,"version":"3.28.0"},"reference-count":4,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,6,25]],"date-time":"2023-06-25T00:00:00Z","timestamp":1687651200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,6,25]],"date-time":"2023-06-25T00:00:00Z","timestamp":1687651200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,6,25]]},"DOI":"10.1109\/drc58590.2023.10186952","type":"proceedings-article","created":{"date-parts":[[2023,7,24]],"date-time":"2023-07-24T17:39:05Z","timestamp":1690220345000},"page":"1-2","source":"Crossref","is-referenced-by-count":0,"title":["Ga<sub>2<\/sub>O<sub>3<\/sub> Heterojunction PN Diodes with Suppressed Background Carrier Concentration for Improved Breakdown Voltage"],"prefix":"10.1109","author":[{"given":"Pengfei","family":"Dong","sequence":"first","affiliation":[{"name":"School of Microelectronics, Xidian University,State Key Discipline Laboratory of Wide Bandgap Semiconductor Technology,Xi&#x0027;an,China,710071"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Chenlu","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Microelectronics, Xidian University,State Key Discipline Laboratory of Wide Bandgap Semiconductor Technology,Xi&#x0027;an,China,710071"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Qinglong","family":"Yan","sequence":"additional","affiliation":[{"name":"School of Microelectronics, Xidian University,State Key Discipline Laboratory of Wide Bandgap Semiconductor Technology,Xi&#x0027;an,China,710071"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yingming","family":"Wang","sequence":"additional","affiliation":[{"name":"The 46th Research Institute, China Electronics Technology Group Corporation,Key Laboratory of Advanced Semiconductor Materials of CETC,Tianjin 300220,China,61005"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jian","family":"Wang","sequence":"additional","affiliation":[{"name":"The 46th Research Institute, China Electronics Technology Group Corporation,Key Laboratory of Advanced Semiconductor Materials of CETC,Tianjin 300220,China,61005"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sami","family":"Alghamdi","sequence":"additional","affiliation":[{"name":"King Abdulaziz University,Electrical and Computer Engineering department,Jeddah,Saudi Arabia,21589"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zhihong","family":"Liu","sequence":"additional","affiliation":[{"name":"School of Microelectronics, Xidian University,State Key Discipline Laboratory of Wide Bandgap Semiconductor Technology,Xi&#x0027;an,China,710071"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jincheng","family":"Zhang","sequence":"additional","affiliation":[{"name":"School of Microelectronics, Xidian University,State Key Discipline Laboratory of Wide Bandgap Semiconductor Technology,Xi&#x0027;an,China,710071"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hong","family":"Zhou","sequence":"additional","affiliation":[{"name":"School of Microelectronics, Xidian University,State Key Discipline Laboratory of Wide Bandgap Semiconductor Technology,Xi&#x0027;an,China,710071"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yue","family":"Hao","sequence":"additional","affiliation":[{"name":"School of Microelectronics, Xidian University,State Key Discipline Laboratory of Wide Bandgap Semiconductor Technology,Xi&#x0027;an,China,710071"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"issue":"3900","key":"ref1","first-page":"1","volume":"13","author":"Zhang","year":"2022","journal-title":"Nat. Comm."},{"issue":"1","key":"ref2","doi-asserted-by":"crossref","first-page":"67","DOI":"10.1109\/LED.2017.2779867","volume":"39","author":"Chabak","year":"2018","journal-title":"IEEE Electron Device Lett."},{"issue":"7","key":"ref3","doi-asserted-by":"crossref","first-page":"902","DOI":"10.1109\/LED.2016.2568139","volume":"37","author":"Green","year":"2016","journal-title":"IEEE Electron Device Lett."},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/led.2020.3015645"}],"event":{"name":"2023 Device Research Conference (DRC)","start":{"date-parts":[[2023,6,25]]},"location":"Santa Barbara, CA, USA","end":{"date-parts":[[2023,6,28]]}},"container-title":["2023 Device Research Conference (DRC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10186880\/10186890\/10186952.pdf?arnumber=10186952","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,1]],"date-time":"2024-03-01T14:53:35Z","timestamp":1709304815000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10186952\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,6,25]]},"references-count":4,"URL":"https:\/\/doi.org\/10.1109\/drc58590.2023.10186952","relation":{},"subject":[],"published":{"date-parts":[[2023,6,25]]}}}