{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,8,26]],"date-time":"2024-08-26T13:02:56Z","timestamp":1724677376069},"reference-count":2,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,6,25]],"date-time":"2023-06-25T00:00:00Z","timestamp":1687651200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,6,25]],"date-time":"2023-06-25T00:00:00Z","timestamp":1687651200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,6,25]]},"DOI":"10.1109\/drc58590.2023.10186972","type":"proceedings-article","created":{"date-parts":[[2023,7,24]],"date-time":"2023-07-24T17:39:05Z","timestamp":1690220345000},"source":"Crossref","is-referenced-by-count":2,"title":["90 nm GaN Technology for Millimeter-Wave Power Applications to W-Band and Beyond"],"prefix":"10.1109","author":[{"given":"Puneet","family":"Srivastava","sequence":"first","affiliation":[{"name":"BAE Systems Inc.,Nashua,NH,USA,03060"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"David F.","family":"Brown","sequence":"additional","affiliation":[{"name":"BAE Systems Inc.,Nashua,NH,USA,03060"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Louis Mt.","family":"Pleasant","sequence":"additional","affiliation":[{"name":"BAE Systems Inc.,Nashua,NH,USA,03060"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Nicholas C.","family":"Miller","sequence":"additional","affiliation":[{"name":"AFRL Sensors Directorate,OH,USA,45433"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Michael","family":"Elliott","sequence":"additional","affiliation":[{"name":"KBR,OH,USA,45433"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ryan","family":"Gilbert","sequence":"additional","affiliation":[{"name":"KBR,OH,USA,45433"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"John R.","family":"Jones","sequence":"additional","affiliation":[{"name":"BAE Systems Inc.,Nashua,NH,USA,03060"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Wenhua","family":"Zhu","sequence":"additional","affiliation":[{"name":"BAE Systems Inc.,Nashua,NH,USA,03060"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hong M.","family":"Lu","sequence":"additional","affiliation":[{"name":"BAE Systems Inc.,Nashua,NH,USA,03060"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Douglas M.","family":"Dugas","sequence":"additional","affiliation":[{"name":"BAE Systems Inc.,Nashua,NH,USA,03060"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kanin","family":"Chu","sequence":"additional","affiliation":[{"name":"BAE Systems Inc.,Nashua,NH,USA,03060"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref2","author":"moon","year":"2022","journal-title":"MTT-IMS"},{"key":"ref1","author":"chung","year":"2010","journal-title":"IEDM Tech Dig"}],"event":{"name":"2023 Device Research Conference (DRC)","location":"Santa Barbara, CA, USA","start":{"date-parts":[[2023,6,25]]},"end":{"date-parts":[[2023,6,28]]}},"container-title":["2023 Device Research Conference (DRC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10186880\/10186890\/10186972.pdf?arnumber=10186972","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,8,14]],"date-time":"2023-08-14T17:36:42Z","timestamp":1692034602000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10186972\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,6,25]]},"references-count":2,"URL":"https:\/\/doi.org\/10.1109\/drc58590.2023.10186972","relation":{},"subject":[],"published":{"date-parts":[[2023,6,25]]}}}