{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,7,23]],"date-time":"2025-07-23T12:03:40Z","timestamp":1753272220214,"version":"3.28.0"},"reference-count":5,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,6,25]],"date-time":"2023-06-25T00:00:00Z","timestamp":1687651200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,6,25]],"date-time":"2023-06-25T00:00:00Z","timestamp":1687651200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,6,25]]},"DOI":"10.1109\/drc58590.2023.10187004","type":"proceedings-article","created":{"date-parts":[[2023,7,24]],"date-time":"2023-07-24T17:39:05Z","timestamp":1690220345000},"page":"1-2","source":"Crossref","is-referenced-by-count":8,"title":["Single-Event Burnout by Cf-252 Irradiation in Vertical $\\beta$-Ga<sub>2<\/sub>O<sub>3<\/sub> Diodes with Pt and PtO<sub>x<\/sub> Schottky Contacts and High Permittivity Dielectric Field Plate"],"prefix":"10.1109","author":[{"given":"Sajal","family":"Islam","sequence":"first","affiliation":[{"name":"Vanderbilt University,Nashville,TN,USA,37235"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Aditha S.","family":"Senarath","sequence":"additional","affiliation":[{"name":"Vanderbilt University,Nashville,TN,USA,37235"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Arijit","family":"Sengupta","sequence":"additional","affiliation":[{"name":"Vanderbilt University,Nashville,TN,USA,37235"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"En Xia","family":"Zhang","sequence":"additional","affiliation":[{"name":"Vanderbilt University,Nashville,TN,USA,37235"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Dennis R.","family":"Ball","sequence":"additional","affiliation":[{"name":"Vanderbilt University,Nashville,TN,USA,37235"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Daniel M.","family":"Fleetwood","sequence":"additional","affiliation":[{"name":"Vanderbilt University,Nashville,TN,USA,37235"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ronald D.","family":"Schrimpf","sequence":"additional","affiliation":[{"name":"Vanderbilt University,Nashville,TN,USA,37235"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Esmat","family":"Farzana","sequence":"additional","affiliation":[{"name":"University of California, Santa Barbara,Santa Barbara,CA,USA,93117"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Arkka","family":"Bhattacharyya","sequence":"additional","affiliation":[{"name":"University of California, Santa Barbara,Santa Barbara,CA,USA,93117"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Nolan S.","family":"Hendricks","sequence":"additional","affiliation":[{"name":"University of California, Santa Barbara,Santa Barbara,CA,USA,93117"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"James S.","family":"Speck","sequence":"additional","affiliation":[{"name":"University of California, Santa Barbara,Santa Barbara,CA,USA,93117"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","first-page":"1430","volume":"68","author":"ball","year":"2021","journal-title":"IEEE-TNS"},{"key":"ref3","first-page":"304003","volume":"55","author":"jian","year":"2022","journal-title":"J Phys"},{"key":"ref5","volume":"70","author":"sengupta","year":"2023","journal-title":"IEEE-TNS"},{"key":"ref2","first-page":"1111041","volume":"10","author":"farzana","year":"2022","journal-title":"Apl mat"},{"key":"ref1","volume":"70","author":"cadena","year":"2023","journal-title":"IEEE-TNS"}],"event":{"name":"2023 Device Research Conference (DRC)","start":{"date-parts":[[2023,6,25]]},"location":"Santa Barbara, CA, USA","end":{"date-parts":[[2023,6,28]]}},"container-title":["2023 Device Research Conference (DRC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10186880\/10186890\/10187004.pdf?arnumber=10187004","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,8,14]],"date-time":"2023-08-14T17:36:30Z","timestamp":1692034590000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10187004\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,6,25]]},"references-count":5,"URL":"https:\/\/doi.org\/10.1109\/drc58590.2023.10187004","relation":{},"subject":[],"published":{"date-parts":[[2023,6,25]]}}}