{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T15:06:07Z","timestamp":1730214367985,"version":"3.28.0"},"reference-count":9,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,6,24]],"date-time":"2024-06-24T00:00:00Z","timestamp":1719187200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,6,24]],"date-time":"2024-06-24T00:00:00Z","timestamp":1719187200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,6,24]]},"DOI":"10.1109\/drc61706.2024.10605475","type":"proceedings-article","created":{"date-parts":[[2024,7,29]],"date-time":"2024-07-29T19:15:01Z","timestamp":1722280501000},"page":"1-2","source":"Crossref","is-referenced-by-count":0,"title":["Analyzing the Dynamics of Store Mechanism and Data Retention through Transient Simulations in Si\/Ge TRAM for Cryogenic Memory Applications"],"prefix":"10.1109","author":[{"given":"Saikat","family":"Chakraborty","sequence":"first","affiliation":[{"name":"University of Texas at Austin,Austin,TX,USA,78712"}]},{"given":"Jaydeep P.","family":"Kulkarni","sequence":"additional","affiliation":[{"name":"University of Texas at Austin,Austin,TX,USA,78712"}]}],"member":"263","reference":[{"issue":"2","key":"ref1","doi-asserted-by":"crossref","first-page":"1031","DOI":"10.1109\/TED.2023.3341052","volume":"71","author":"Chakraborty","year":"2024","journal-title":"IEEE TED"},{"key":"ref2","first-page":"283","author":"Nemati","year":"1999","journal-title":"IEDM Tech. Dig."},{"issue":"9","key":"ref3","doi-asserted-by":"crossref","first-page":"921","DOI":"10.1109\/LED.2014.2336674","volume":"35","author":"Mulaosmanovic","year":"2014","journal-title":"IEEE EDL"},{"issue":"6","key":"ref4","first-page":"468","volume":"3","author":"Badwan","year":"2015","journal-title":"IEEE, JEDS"},{"key":"ref5","first-page":"1","author":"Chakraborty","year":"2022","journal-title":"DRC"},{"issue":"4","key":"ref6","doi-asserted-by":"crossref","first-page":"1170","DOI":"10.1109\/TED.2015.2398460","volume":"62","author":"Mulaosmanovic","year":"2015","journal-title":"IEEE TED"},{"key":"ref7","first-page":"311","author":"Cho","year":"2005","journal-title":"IEDM"},{"issue":"2","key":"ref8","doi-asserted-by":"crossref","first-page":"292","DOI":"10.1109\/TED.2011.2175228","volume":"59","author":"Kao","year":"2012","journal-title":"IEEE TED"},{"key":"ref9","first-page":"193","author":"Wong","year":"2020","journal-title":"SISPAD"}],"event":{"name":"2024 Device Research Conference (DRC)","start":{"date-parts":[[2024,6,24]]},"location":"College Park, MD, USA","end":{"date-parts":[[2024,6,26]]}},"container-title":["2024 Device Research Conference (DRC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10605129\/10605242\/10605475.pdf?arnumber=10605475","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,7,30]],"date-time":"2024-07-30T05:23:19Z","timestamp":1722316999000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10605475\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,6,24]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/drc61706.2024.10605475","relation":{},"subject":[],"published":{"date-parts":[[2024,6,24]]}}}