{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,7,12]],"date-time":"2025-07-12T01:24:45Z","timestamp":1752283485154},"reference-count":29,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2004]]},"DOI":"10.1109\/dsd.2004.1333252","type":"proceedings-article","created":{"date-parts":[[2004,11,8]],"date-time":"2004-11-08T16:27:50Z","timestamp":1099931270000},"page":"5-11","source":"Crossref","is-referenced-by-count":17,"title":["Reliability and power management of integrated systems"],"prefix":"10.1109","author":[{"given":"K.","family":"Mihic","sequence":"first","affiliation":[]},{"given":"T.","family":"Simunic","sequence":"additional","affiliation":[]},{"given":"G.","family":"De Micheli","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"19","doi-asserted-by":"publisher","DOI":"10.1147\/rd.435.0863"},{"key":"17","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.1999.809458"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1109\/FTCS.1999.781037"},{"journal-title":"International Sematech Technology Transfer Document 03024377A-TR","article-title":"Critical reliability challenges for the international technology roadmap for semiconductors","year":"2003","key":"15"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1109\/43.931003"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2002.998257"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1145\/277858.277892"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2002.1028924"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2003.1240944"},{"key":"21","article-title":"Saving energy with architectural and frequency adaptations for multimedia applications","author":"hughes","year":"2001","journal-title":"Proc 25th Annu Int Symp Microarchitecture"},{"key":"20","article-title":"RAMP: A model for reliability aware microprocessor design","author":"srinivasan","year":"2003","journal-title":"IBM Research Report"},{"key":"22","doi-asserted-by":"publisher","DOI":"10.1145\/859618.859636"},{"key":"23","doi-asserted-by":"publisher","DOI":"10.1145\/782814.782831"},{"key":"24","article-title":"Dynamic fault-tolerance management in failure-prone and battery-powered systems","author":"stanley-marbell","year":"0","journal-title":"IWSC"},{"key":"25","article-title":"A case study in NOC design for embedded video","author":"xu","year":"0","journal-title":"DATE 2004"},{"key":"26","article-title":"High-level system modeling and architecture exploration with SystemC on a NOC SoC: S3C2510 case study","author":"jang","year":"0","journal-title":"DATE 2004"},{"journal-title":"AMBA Specification","year":"1999","key":"27"},{"journal-title":"The CoreConnect Bus architecture","year":"1999","key":"28"},{"key":"29","article-title":"The impact of technology scaling on processor lifetime reliability","author":"srinivasan","year":"2003","journal-title":"UIUC CS Tech Report"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2000.840047"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/2.976921"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1978.1675145"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1016\/S0038-1101(02)00151-X"},{"journal-title":"International Technology Roadmap for Semiconductors 2001","year":"0","key":"7"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1007\/b105353"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2003.1253633"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/ISVLSI.2002.1016885"},{"key":"9","article-title":"Design methodology of a low-energy reconfigurable single-chip DPS system","author":"wan","year":"2000","journal-title":"Journal of VLSI Signal Processing"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2002.1012681"}],"event":{"name":"Euromicro Symposium on Digital System Design, 2004. DSD 2004.","start":{"date-parts":[[2004,9,3]]},"location":"Rennes, France","end":{"date-parts":[[2004,9,3]]}},"container-title":["Euromicro Symposium on Digital System Design, 2004. DSD 2004."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/9267\/29440\/01333252.pdf?arnumber=1333252","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,14]],"date-time":"2017-03-14T03:13:40Z","timestamp":1489461220000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1333252\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2004]]},"references-count":29,"URL":"https:\/\/doi.org\/10.1109\/dsd.2004.1333252","relation":{},"subject":[],"published":{"date-parts":[[2004]]}}}