{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T02:32:45Z","timestamp":1729650765415,"version":"3.28.0"},"reference-count":15,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2007,8]]},"DOI":"10.1109\/dsd.2007.4341470","type":"proceedings-article","created":{"date-parts":[[2007,10,9]],"date-time":"2007-10-09T13:45:59Z","timestamp":1191937559000},"page":"207-214","source":"Crossref","is-referenced-by-count":0,"title":["The Criteria of Functional Delay Test Quality Assessment"],"prefix":"10.1109","author":[{"given":"E.","family":"Bareisa","sequence":"first","affiliation":[]},{"given":"V.","family":"Jusas","sequence":"additional","affiliation":[]},{"given":"K.","family":"Motiejunas","sequence":"additional","affiliation":[]},{"given":"R.","family":"Seinauskas","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1109\/TEST.1997.639688"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1109\/12.980008"},{"key":"ref12","first-page":"968","article-title":"B-algorithm: a Behavioral Test Generation Algorithm","author":"cho","year":"1994","journal-title":"Proceedings of International Test Conference"},{"doi-asserted-by":"publisher","key":"ref13","DOI":"10.1109\/GLSV.1997.580515"},{"doi-asserted-by":"publisher","key":"ref14","DOI":"10.1109\/HLDVT.2002.1224448"},{"doi-asserted-by":"publisher","key":"ref15","DOI":"10.1145\/504914.504916"},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1007\/s10836-005-3476-y"},{"key":"ref3","first-page":"27","article-title":"A Fault Model for Function and Delay Testing","author":"yi","year":"2001","journal-title":"Proc European Test Workshop"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1109\/TC.1981.1675757"},{"key":"ref5","doi-asserted-by":"crossref","first-page":"290","DOI":"10.1109\/43.908472","article-title":"Realization-Independent ATPG for Designs with Unimplemented Blocks","volume":"20","author":"kim","year":"2001","journal-title":"IEEE Trans on CAD"},{"key":"ref8","first-page":"95","article-title":"Application of Functional Delay Tests for Testing of Transition Faults and Vice Versa","volume":"34","author":"bareisa","year":"2005","journal-title":"information technology and control"},{"key":"ref7","first-page":"19","article-title":"The Realization-Independent Testing Based on the Black Box Models","volume":"16","author":"bareisa","year":"2005","journal-title":"INFORMATICA Institute of Mathematics and Informatics Vilnius"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1023\/A:1008389920806"},{"key":"ref1","first-page":"281","article-title":"Functional Digital Systems Testing","author":"barei\u0161a","year":"2006"},{"key":"ref9","first-page":"19","article-title":"Transition Test Supplement","volume":"67","author":"bareisa","year":"2006","journal-title":"Elektronika ir elektrotechnika = Electronics and electrical engineering"}],"event":{"name":"10th Euromicro Conference on Digital System Design Architectures, Methods and Tools (DSD 2007)","start":{"date-parts":[[2007,8,29]]},"location":"Lubeck, Germany","end":{"date-parts":[[2007,8,31]]}},"container-title":["10th Euromicro Conference on Digital System Design Architectures, Methods and Tools (DSD 2007)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4341432\/4341433\/04341470.pdf?arnumber=4341470","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,17]],"date-time":"2017-06-17T19:46:25Z","timestamp":1497728785000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4341470\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2007,8]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/dsd.2007.4341470","relation":{},"subject":[],"published":{"date-parts":[[2007,8]]}}}