{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,7]],"date-time":"2026-01-07T08:03:31Z","timestamp":1767773011889,"version":"3.37.3"},"reference-count":17,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,7,22]],"date-time":"2022-07-22T00:00:00Z","timestamp":1658448000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,7,22]],"date-time":"2022-07-22T00:00:00Z","timestamp":1658448000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100004826","name":"Beijing Natural Science Foundation","doi-asserted-by":"publisher","award":["L212033"],"award-info":[{"award-number":["L212033"]}],"id":[{"id":"10.13039\/501100004826","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,7,22]]},"DOI":"10.1109\/dsit55514.2022.9943875","type":"proceedings-article","created":{"date-parts":[[2022,11,17]],"date-time":"2022-11-17T20:39:41Z","timestamp":1668717581000},"page":"1-6","source":"Crossref","is-referenced-by-count":4,"title":["A Small-sample Intelligent Fault Diagnosis Method Based on Deep Transfer Learning"],"prefix":"10.1109","author":[{"given":"Juanru","family":"Zhao","sequence":"first","affiliation":[{"name":"School of Automation Science and Electrical Engineering, Beihang University,Beijing,China"}]},{"given":"Mei","family":"Yuan","sequence":"additional","affiliation":[{"name":"School of Automation Science and Electrical Engineering, Beihang University,Beijing,China"}]},{"given":"Jin","family":"Cui","sequence":"additional","affiliation":[{"name":"Research Institute for Frontier Science, Beihang University,Beijing,China"}]},{"given":"Shaopeng","family":"Dong","sequence":"additional","affiliation":[{"name":"School of Automation Science and Electrical Engineering, Beihang University,Beijing,China"}]},{"given":"Yufeng","family":"Qu","sequence":"additional","affiliation":[{"name":"Research Institute for Frontier Science, Beihang University,Beijing,China"}]},{"given":"Ben","family":"Xu","sequence":"additional","affiliation":[{"name":"School of Automation Science and Electrical Engineering, Beihang University,Beijing,China"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/LGRS.2021.3083262"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2020.3035253"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TASLP.2019.2944078"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2767540"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/s10845-020-01600-2"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3119135"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2020.3029058"},{"journal-title":"CWRU data","year":"0","key":"ref17"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2939876"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2868023"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2020.108202"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/ab6ade"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2877090"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2019.2957232"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.amc.2021.126318"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.future.2019.03.026"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/3065386"}],"event":{"name":"2022 5th International Conference on Data Science and Information Technology (DSIT)","start":{"date-parts":[[2022,7,22]]},"location":"Shanghai, China","end":{"date-parts":[[2022,7,24]]}},"container-title":["2022 5th International Conference on Data Science and Information Technology (DSIT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9943793\/9943812\/09943875.pdf?arnumber=9943875","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,12,12]],"date-time":"2022-12-12T20:00:36Z","timestamp":1670875236000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9943875\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,7,22]]},"references-count":17,"URL":"https:\/\/doi.org\/10.1109\/dsit55514.2022.9943875","relation":{},"subject":[],"published":{"date-parts":[[2022,7,22]]}}}