{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,25]],"date-time":"2025-09-25T18:07:53Z","timestamp":1758823673857,"version":"3.28.0"},"reference-count":40,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2008]]},"DOI":"10.1109\/dsn.2008.4630068","type":"proceedings-article","created":{"date-parts":[[2008,9,26]],"date-time":"2008-09-26T15:10:29Z","timestamp":1222441829000},"page":"32-41","source":"Crossref","is-referenced-by-count":27,"title":["A study of cognitive resilience in a JPEG compressor"],"prefix":"10.1109","author":[{"given":"Damian","family":"Nowroth","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ilia","family":"Polian","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Bernd","family":"Becker","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"year":"0","key":"19"},{"key":"35","doi-asserted-by":"publisher","DOI":"10.1109\/32.44380"},{"key":"17","article-title":"new quality metric for multimedia compression using faulty hardware","author":"chong","year":"2006","journal-title":"Int'l Workshop on Video Processing and Quality Metrics for Consumer Electronics"},{"key":"36","first-page":"199","article-title":"rifle: a general purpose pin-level fault injector","author":"madeira","year":"1994","journal-title":"Proc First European Dependable Computing Conference (EDCC-1)"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2007.38"},{"key":"33","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2006.82"},{"key":"15","doi-asserted-by":"crossref","DOI":"10.1109\/DFTVS.2005.38","article-title":"hardware testing for error tolerant multimedia compression based on linear transforms","author":"chong","year":"2005","journal-title":"Proc IEEE Int Symp Defect and Fault Tolerance in VLSI Systems"},{"journal-title":"JPEG hardware compressor - opencores org","year":"0","key":"34"},{"year":"0","key":"16"},{"key":"39","doi-asserted-by":"publisher","DOI":"10.1109\/FTCS.1994.315656"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2006.887832"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/DSD.2005.58"},{"key":"37","doi-asserted-by":"publisher","DOI":"10.1109\/FTCS.1990.89371"},{"key":"11","first-page":"249","article-title":"an analysis framework for transient-error tolerance. in vlsi","author":"hayes","year":"2007","journal-title":"Test Symp"},{"key":"38","doi-asserted-by":"publisher","DOI":"10.1109\/24.58726"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2007.364501"},{"key":"21","first-page":"261","article-title":"an fpga-based approach for speeding-up fault injection campaigns on safety-critical circuits. jour. of electronic testing","volume":"18","author":"civera","year":"2002","journal-title":"Theory and Applications"},{"journal-title":"Reliable Computer Systems - Design and Evaluation","year":"1992","author":"siewiorek","key":"20"},{"key":"40","doi-asserted-by":"publisher","DOI":"10.1109\/FTCS.1997.614074"},{"key":"22","first-page":"137","article-title":"a soft error emulation system for logic circuits","author":"kundu","year":"2005","journal-title":"Conf on Design of Circuits and Integrated Systems"},{"key":"23","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2004.1311877"},{"key":"24","doi-asserted-by":"publisher","DOI":"10.1109\/ISCA.2004.1310780"},{"key":"25","doi-asserted-by":"publisher","DOI":"10.1109\/HPCA.2007.346196"},{"key":"26","doi-asserted-by":"publisher","DOI":"10.1109\/5.259428"},{"key":"27","article-title":"period of grace: a new paradigm for efficient soft error hardening","author":"polian","year":"2006","journal-title":"GI\/ITG Workshop Testmethoden und Zuverla?ssigkeit von Schaltungen und Systemen"},{"key":"28","doi-asserted-by":"publisher","DOI":"10.1109\/79.855913"},{"year":"0","key":"29"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2002.1028924"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.2003.1197722"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2006.17"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2003.813129"},{"key":"30","doi-asserted-by":"publisher","DOI":"10.2200\/S00010ED1V01Y200508IVM003"},{"key":"7","doi-asserted-by":"crossref","first-page":"433","DOI":"10.1109\/DFTVS.2003.1250141","article-title":"partial error masking to reduce soft error failure rate in logic circuits","author":"mohanram","year":"2003","journal-title":"Int'l Symp on Defect and Fault Tolerance"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2005.69"},{"journal-title":"SSIM C++ implementation","year":"0","key":"32"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2005.1584070"},{"key":"31","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2003.819861"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2002.805402"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2005.95"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1271075"}],"event":{"name":"2008 IEEE International Conference on Dependable Systems and Networks With FTCS and DCC (DSN)","start":{"date-parts":[[2008,6,24]]},"location":"Anchorage, AK","end":{"date-parts":[[2008,6,27]]}},"container-title":["2008 IEEE International Conference on Dependable Systems and Networks With FTCS and DCC (DSN)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4610267\/4630050\/04630068.pdf?arnumber=4630068","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,5,14]],"date-time":"2019-05-14T06:50:22Z","timestamp":1557816622000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4630068\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008]]},"references-count":40,"URL":"https:\/\/doi.org\/10.1109\/dsn.2008.4630068","relation":{},"subject":[],"published":{"date-parts":[[2008]]}}}