{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T00:08:45Z","timestamp":1725754125215},"reference-count":15,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2009,6]]},"DOI":"10.1109\/dsn.2009.5270301","type":"proceedings-article","created":{"date-parts":[[2009,9,30]],"date-time":"2009-09-30T14:41:36Z","timestamp":1254321696000},"page":"478-483","source":"Crossref","is-referenced-by-count":7,"title":["A low-tech solution to avoid the severe impact of transient errors on the IP interconnect"],"prefix":"10.1109","author":[{"given":"Derek","family":"Graham","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Per","family":"Strid","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Scott","family":"Roy","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Fernando","family":"Rodriguez","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"15","doi-asserted-by":"publisher","DOI":"10.1147\/rd.401.0019"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.2006.251220"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1996.569906"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1147\/rd.523.0275"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1063\/1.1567461"},{"journal-title":"3 axi specification","year":"0","author":"amba","key":"3"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2003.818146"},{"key":"1","article-title":"accelerated testing of a 90nm sparc64 v microprocessor for neutron ser","author":"ando","year":"2007","journal-title":"IEEE Workshop on Silicon Errors in Logic - System Effects (SELSE)"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/T-ED.1979.19370"},{"year":"0","key":"7"},{"journal-title":"Functional safety and iec","first-page":"61508","year":"0","key":"6"},{"key":"5","article-title":"a perspective on developing ip for embedded reliability","author":"bradley","year":"2007","journal-title":"IEEE Workshop on Silicon Errors in Logic - System Effects"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2005.853449"},{"journal-title":"Silicon safeguards automotive circuits","year":"0","author":"marsh","key":"9"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1147\/rd.516.0763"}],"event":{"name":"Networks (DSN)","start":{"date-parts":[[2009,6,29]]},"location":"Lisbon, Portugal","end":{"date-parts":[[2009,7,2]]}},"container-title":["2009 IEEE\/IFIP International Conference on Dependable Systems & Networks"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5243642\/5270274\/05270301.pdf?arnumber=5270301","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,18]],"date-time":"2017-03-18T18:40:47Z","timestamp":1489862447000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5270301\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2009,6]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/dsn.2009.5270301","relation":{},"subject":[],"published":{"date-parts":[[2009,6]]}}}