{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,18]],"date-time":"2025-11-18T12:15:43Z","timestamp":1763468143374},"reference-count":26,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,6]]},"DOI":"10.1109\/dsn.2013.6575316","type":"proceedings-article","created":{"date-parts":[[2013,8,14]],"date-time":"2013-08-14T16:18:36Z","timestamp":1376497116000},"source":"Crossref","is-referenced-by-count":16,"title":["Detecting malicious landing pages in Malware Distribution Networks"],"prefix":"10.1109","author":[{"given":"Gang","family":"Wang","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jack W.","family":"Stokes","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Cormac","family":"Herley","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"David","family":"Felstead","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"19","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2010.5450504"},{"key":"17","first-page":"411","article-title":"Proactive NBTI mitigation for busy functional units in out-of-order microprocessors","author":"li","year":"2010","journal-title":"Proceedings of the Conference on Design Automation and Test"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2011.5770695"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2007.896317"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2007.11"},{"key":"13","first-page":"1","article-title":"Measuring power and temperature from real processors","author":"mesa","year":"2008","journal-title":"Parallel and Distributed Processing IEEE International Symposium on"},{"key":"14","article-title":"Temperature aware floorplanning","author":"yongkui han","year":"2005","journal-title":"Temperature-Aware Computer Systems"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2007.79"},{"key":"12","doi-asserted-by":"crossref","DOI":"10.1007\/978-1-4020-8363-1","author":"pavlov","year":"2008","journal-title":"CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies Process-Aware SRAM Design and Test"},{"key":"21","article-title":"The openrisc processor: Open hardware and linux","author":"tandon","year":"2011","journal-title":"Linux J"},{"key":"20","first-page":"546","article-title":"Low power aging-aware register file design by duty cycle balancing","author":"wang","year":"2012","journal-title":"Design Automation Test in Europe Conference Exhibition (DATE)"},{"key":"22","first-page":"3","article-title":"Mibench: A free, commercially representative embedded benchmark suite","author":"guthaus","year":"2001","journal-title":"Proceedings of the Workload Characterization IEEE International Workshop"},{"key":"23","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.1997.645830"},{"key":"24","year":"0"},{"key":"25","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2002.993068"},{"key":"26","doi-asserted-by":"publisher","DOI":"10.1007\/s10766-005-7301-0"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1145\/1146909.1147172"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2008.4484047"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1145\/1229175.1229176"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/ISVLSI.2010.15"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/VLSID.2011.68"},{"key":"6","doi-asserted-by":"crossref","first-page":"421","DOI":"10.1145\/1176760.1176811","article-title":"Cost-efficient soft error protection for embedded microprocessors","author":"blome","year":"2006","journal-title":"Proceedings of the 2006 International Conference on Compilers Architecture and Synthesis for Embedded Systems"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2005.181"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2009.03.016"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2006.320885"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/ESSCIR.2005.1541635"}],"event":{"name":"2013 43rd Annual IEEE\/IFIP International Conference on Dependable Systems and Networks (DSN)","location":"Budapest, Hungary","start":{"date-parts":[[2013,6,24]]},"end":{"date-parts":[[2013,6,27]]}},"container-title":["2013 43rd Annual IEEE\/IFIP International Conference on Dependable Systems and Networks (DSN)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6569391\/6575287\/06575316.pdf?arnumber=6575316","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,21]],"date-time":"2017-06-21T17:50:12Z","timestamp":1498067412000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6575316\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,6]]},"references-count":26,"URL":"https:\/\/doi.org\/10.1109\/dsn.2013.6575316","relation":{},"subject":[],"published":{"date-parts":[[2013,6]]}}}