{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T15:21:08Z","timestamp":1730215268508,"version":"3.28.0"},"reference-count":21,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,3]]},"DOI":"10.1109\/dtis.2013.6527786","type":"proceedings-article","created":{"date-parts":[[2013,6,25]],"date-time":"2013-06-25T14:55:29Z","timestamp":1372172129000},"page":"98-103","source":"Crossref","is-referenced-by-count":1,"title":["Synthesis of multiple fault oriented test groups from single fault test sets"],"prefix":"10.1109","author":[{"given":"Raimund","family":"Ubar","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S.","family":"Kostin","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J.","family":"Raik","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"19","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS.2012.6219064"},{"key":"17","first-page":"212","author":"agrawal","year":"1996","journal-title":"Compact and Complete Test Set Generation for MUltiple Stuck-at Faults"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1109\/LATW.2012.6261243"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1109\/RFTS.1991.212943"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.1994.367254"},{"key":"13","first-page":"113","author":"birger","year":"1975","journal-title":"Testing of MUltiple Faults in Comb"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/43.3952"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS.1993.343020"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/GLSV.1997.580405"},{"key":"21","doi-asserted-by":"publisher","DOI":"10.1109\/DSD.2012.75"},{"key":"3","first-page":"171","article-title":"Multiple fault detection in two-level multioutput circuits","volume":"3","author":"jacob","year":"1992","journal-title":"JETIA"},{"key":"20","doi-asserted-by":"publisher","DOI":"10.1109\/54.485782"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/FTCS.1991.146656"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/ETC.1993.246557"},{"key":"1","article-title":"Multiple fault diagnosis in comb","author":"abramovici","year":"1980","journal-title":"Circuits Based on An Effect-Cause Analysis IEEE Trans On Compo C-29"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2009.5196027"},{"key":"6","first-page":"25","article-title":"Verification and Analysis of SelfChecking Properties through ATPG","author":"hunger","year":"2008","journal-title":"14th IEEE IOL TS"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.1992.229933"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1007\/BF00971973"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/CISE.2010.5676989"},{"key":"8","first-page":"1","article-title":"Multiple faults: Modeling, simulation and test","author":"kim","year":"2002","journal-title":"Proc 15th Int Conf VLSI Design"}],"event":{"name":"2013 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)","start":{"date-parts":[[2013,3,26]]},"location":"Abu Dhabi","end":{"date-parts":[[2013,3,28]]}},"container-title":["2013 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6520922\/6527765\/06527786.pdf?arnumber=6527786","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,22]],"date-time":"2017-03-22T20:29:53Z","timestamp":1490214593000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6527786\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,3]]},"references-count":21,"URL":"https:\/\/doi.org\/10.1109\/dtis.2013.6527786","relation":{},"subject":[],"published":{"date-parts":[[2013,3]]}}}