{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T22:03:31Z","timestamp":1725573811809},"reference-count":20,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2014,5]]},"DOI":"10.1109\/dtis.2014.6850656","type":"proceedings-article","created":{"date-parts":[[2014,7,29]],"date-time":"2014-07-29T18:24:23Z","timestamp":1406658263000},"page":"1-6","source":"Crossref","is-referenced-by-count":1,"title":["Linking aging measurements of health-monitors and specifications for multi-processor SoCs"],"prefix":"10.1109","author":[{"given":"Hans G.","family":"Kerkhoff","sequence":"first","affiliation":[]},{"family":"Jinbo Wan","sequence":"additional","affiliation":[]},{"given":"Yong","family":"Zhao","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"19","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2003.1232251"},{"year":"0","key":"17"},{"year":"0","key":"18"},{"journal-title":"ProCheck? A Comprehensive Fabrication Process Mismatch and Reliability Characterization Tool","year":"2013","author":"mikkola","key":"15"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2010.04.024"},{"year":"0","key":"13"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/5.293157"},{"key":"11","article-title":"Xentium health test plan","author":"zhao","year":"2014","journal-title":"Technical Report D3 4 c"},{"year":"0","key":"12"},{"key":"3","first-page":"53","article-title":"A dependability solution for homogeneous MP-SoCs","author":"zhang","year":"2011","journal-title":"17th IEEE Pacific Rim Dependability Conference (PRDC) USA"},{"key":"20","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2005.22"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2009.149"},{"journal-title":"Reliability & Manufacturability","year":"2011","key":"1"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1115\/1.3159045"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2008.917502"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/TCAPT.2006.870387"},{"key":"5","first-page":"31","article-title":"An embedded health-monitoring infrastructure for a reliable multi-core Processor","author":"zhao","year":"2013","journal-title":"Proc Manufacturable and Dependable Multicore Architectures at Nanoscale (MEDIAN) Workshop"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS.2012.6219039"},{"journal-title":"Kryotech SuperG Athlon 1000MHz","year":"1999","author":"shimi","key":"9"},{"key":"8","first-page":"56","article-title":"Power-dissipation comparison of two dependability approaches for multi-processor systems","author":"zhao","year":"2013","journal-title":"Design and Technology of Integrated System in Nanoscale Era (DTIS)"}],"event":{"name":"2014 9th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)","start":{"date-parts":[[2014,5,6]]},"location":"Santorini, Greece","end":{"date-parts":[[2014,5,8]]}},"container-title":["2014 9th IEEE International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6844517\/6850634\/06850656.pdf?arnumber=6850656","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,23]],"date-time":"2017-03-23T17:36:55Z","timestamp":1490290615000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6850656\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,5]]},"references-count":20,"URL":"https:\/\/doi.org\/10.1109\/dtis.2014.6850656","relation":{},"subject":[],"published":{"date-parts":[[2014,5]]}}}