{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T23:29:28Z","timestamp":1725492568304},"reference-count":7,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,4]]},"DOI":"10.1109\/dtis.2015.7127346","type":"proceedings-article","created":{"date-parts":[[2015,6,18]],"date-time":"2015-06-18T16:07:41Z","timestamp":1434643661000},"page":"1-2","source":"Crossref","is-referenced-by-count":0,"title":["Test set embedding into hardware generated sequences using an embedding algorithm"],"prefix":"10.1109","author":[{"given":"I.","family":"Voyiatzis","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"D.","family":"Kavvadias","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S.","family":"Sinitos","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"K.","family":"Vlahantonis","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"P.","family":"Kyrkos","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"C.","family":"Sgouropoulou","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"C.","family":"Efstathiou","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1998.743181"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/43.743738"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.1989.100747"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/PCI.2010.44"},{"article-title":"On the Generation of Test Patterns for Combinational Circuits","year":"0","author":"lee","key":"ref7"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/43.384416"},{"key":"ref1","article-title":"Digital Systems Testing and Testable Design","author":"abramovici","year":"1990","journal-title":"Computer Science Press"}],"event":{"name":"2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)","start":{"date-parts":[[2015,4,21]]},"location":"Napoli, Italy","end":{"date-parts":[[2015,4,23]]}},"container-title":["2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7118811\/7127334\/07127346.pdf?arnumber=7127346","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,24]],"date-time":"2017-03-24T13:57:50Z","timestamp":1490363870000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7127346\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,4]]},"references-count":7,"URL":"https:\/\/doi.org\/10.1109\/dtis.2015.7127346","relation":{},"subject":[],"published":{"date-parts":[[2015,4]]}}}