{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T06:31:33Z","timestamp":1729665093908,"version":"3.28.0"},"reference-count":17,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,4]]},"DOI":"10.1109\/dtis.2015.7127377","type":"proceedings-article","created":{"date-parts":[[2015,6,18]],"date-time":"2015-06-18T16:07:41Z","timestamp":1434643661000},"page":"1-6","source":"Crossref","is-referenced-by-count":7,"title":["STT-MRAM cell reliability evaluation under process, voltage and temperature (PVT) variations"],"prefix":"10.1109","author":[{"given":"Elena I.","family":"Vatajelu","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Rosa","family":"Rodriguez-Montanes","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Marco","family":"Indaco","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Paolo","family":"Prinetto","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Joan","family":"Figueras","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","first-page":"1","article-title":"Robust low-power multi-terminal STT-MRAM","author":"xuanyao","year":"2013","journal-title":"Non-Volatile Memory Technology Symposium (NVMTS)"},{"key":"ref11","doi-asserted-by":"crossref","first-page":"384","DOI":"10.1109\/TVLSI.2013.2239671","article-title":"Failure mitigation techniques for 1T-1MTJ Spin-Transfer Torque MRAM bit-cells","volume":"22","author":"xuanyao","year":"2014","journal-title":"Very Large Scale Integration (VLSI) Systems IEEE Transactions on"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2010.5433948"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2003.810048"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2011.5763159"},{"key":"ref15","first-page":"139","article-title":"A study of dielectric breakdown mechanism in CoFeB\/MgO\/CoFeB magnetic tunnel junction","year":"2009","journal-title":"Reliability Physics Symposium"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRev.130.1677"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1063\/1.358282"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2006.884077"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2009.2032192"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ISLPED.2011.5993623"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/NANO.2011.6144606"},{"key":"ref8","doi-asserted-by":"crossref","first-page":"447","DOI":"10.7873\/DATE.2015.0822","article-title":"Read\/Write Robustness Estimation Metrics for Spin Transfer Torque (STT) MRAM Cell","author":"elena i vatajelu","year":"2015","journal-title":"Design Automation Test in Europe Conference Exhibition (DATE)"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2012.06.035"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2009.2027907"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2005.1609379"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2015.7138748"}],"event":{"name":"2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)","start":{"date-parts":[[2015,4,21]]},"location":"Napoli, Italy","end":{"date-parts":[[2015,4,23]]}},"container-title":["2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7118811\/7127334\/07127377.pdf?arnumber=7127377","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,8,27]],"date-time":"2019-08-27T04:16:38Z","timestamp":1566879398000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7127377\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,4]]},"references-count":17,"URL":"https:\/\/doi.org\/10.1109\/dtis.2015.7127377","relation":{},"subject":[],"published":{"date-parts":[[2015,4]]}}}