{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,29]],"date-time":"2025-09-29T11:49:14Z","timestamp":1759146554406},"reference-count":18,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,4]]},"DOI":"10.1109\/dtis.2016.7483887","type":"proceedings-article","created":{"date-parts":[[2016,6,2]],"date-time":"2016-06-02T13:07:27Z","timestamp":1464872847000},"page":"1-6","source":"Crossref","is-referenced-by-count":8,"title":["Voltage over-scaling in sequential circuits for approximate computing"],"prefix":"10.1109","author":[{"given":"David","family":"May","sequence":"first","affiliation":[]},{"given":"Walter","family":"Stechele","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1007\/s11265-012-0667-5"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2010.5419690"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2011.5763153"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2011.6105401"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2009.2012863"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/SAMOS.2012.6404190"},{"key":"ref16","first-page":"73","article-title":"Design of fine-grained sequential approximate circuits using probability-aware fault emulation","year":"2015","journal-title":"Low Power Electronics and Design (ISLPED) 2015 IEEE\/ACM International Symposium on IEEE"},{"key":"ref17","article-title":"Composite current source (ccs) modeling technology backgrounder","author":"mekhtarian","year":"2005","journal-title":"Synopsys Inc"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1145\/263272.263323"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/2744769.2751163"},{"key":"ref3","first-page":"365","article-title":"Dark silicon and the end of multicore scaling","author":"esmaeilzadeh","year":"2011","journal-title":"2011 38th Annual International Symposium on Computer Architecture (ISCA) ISCA"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/92.974895"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2013.6569370"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2011.5763154"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2004.826201"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/N-SSC.2007.4785534"},{"year":"2013","key":"ref1","article-title":"The International Technology Roadmap for Semiconductors (ITRS), System Drivers"},{"key":"ref9","first-page":"1","article-title":"Controlled timing-error acceptance for low energy idct design","author":"he","year":"2011","journal-title":"Design Automation & Test in Europe Conference & Exhibition (DATE) 2011"}],"event":{"name":"2016 International Conference on Design and Technology of Integrated Systems in Nanoscale Era (DTIS)","start":{"date-parts":[[2016,4,12]]},"location":"Istanbul, Turkey","end":{"date-parts":[[2016,4,14]]}},"container-title":["2016 International Conference on Design and Technology of Integrated Systems in Nanoscale Era (DTIS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7480180\/7483795\/07483887.pdf?arnumber=7483887","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2016,9,27]],"date-time":"2016-09-27T22:54:37Z","timestamp":1475016877000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7483887\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,4]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/dtis.2016.7483887","relation":{},"subject":[],"published":{"date-parts":[[2016,4]]}}}