{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T15:21:42Z","timestamp":1730215302485,"version":"3.28.0"},"reference-count":15,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,4]]},"DOI":"10.1109\/dtis.2017.7930174","type":"proceedings-article","created":{"date-parts":[[2017,5,18]],"date-time":"2017-05-18T22:36:34Z","timestamp":1495146994000},"page":"1-5","source":"Crossref","is-referenced-by-count":3,"title":["Using transition fault test patterns for cost effective offline performance estimation"],"prefix":"10.1109","author":[{"given":"Mahroo","family":"Zandrahimi","sequence":"first","affiliation":[]},{"given":"Philippe","family":"Debaud","sequence":"additional","affiliation":[]},{"given":"Armand","family":"Castillejo","sequence":"additional","affiliation":[]},{"given":"Zaid","family":"Al-Ars","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"journal-title":"Test and Diagnosis for Small-Delay Defects","year":"2011","author":"tehranipoor","key":"ref10"},{"journal-title":"SCOAP Sandia Control-lability\/Observability Analysis Program in DAC","year":"1980","author":"goldstein","key":"ref11"},{"journal-title":"On Performance Testing with Path Delay Patterns in VTS","year":"2007","author":"kruseman","key":"ref12"},{"year":"0","key":"ref13"},{"year":"0","key":"ref14"},{"year":"0","key":"ref15"},{"key":"ref4","first-page":"294","author":"burd","year":"2000","journal-title":"A dynamic voltage scaled microprocessor system"},{"key":"ref3","first-page":"398","author":"drake","year":"2007","journal-title":"A Distributed Critical-Path Timing Monitor for a 65nm High-Performance Microprocessor in ISSCC"},{"key":"ref6","first-page":"211","volume":"29","author":"liu","year":"2010","journal-title":"Capturing Post-Silicon Variations Using a Representative Critical Path in TCAD"},{"key":"ref5","first-page":"639","volume":"37","author":"kim","year":"2002","journal-title":"An efficient digitalsliding controller for adaptive power-supply regulation in IJSSC"},{"journal-title":"Industrial Approaches for Performance Evaluation Using On-Chip Monitors in IDT","year":"2016","author":"zandrahimi","key":"ref8"},{"key":"ref7","first-page":"69","author":"zandrahimi","year":"2014","journal-title":"A Survey on Low-power Techniques for Single and Multicore Systems in ICCASA"},{"key":"ref2","first-page":"633","author":"chan","year":"2012","journal-title":"DDRO A Novel Performance Monitoring Methodology Based on Design-Dependent Ring Oscillators in ISQED"},{"key":"ref1","first-page":"7","author":"chan","year":"2012","journal-title":"Tunable Sensors for Process-Aware Voltage Scaling in ICCAD"},{"journal-title":"Challenges of Using On-Chip Performance Monitors for Process and Environmental Variation Compensation in DATE","year":"2016","author":"zandrahimi","key":"ref9"}],"event":{"name":"2017 12th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS)","start":{"date-parts":[[2017,4,4]]},"location":"Palma de Mallorca, Spain","end":{"date-parts":[[2017,4,6]]}},"container-title":["2017 12th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7921855\/7929862\/07930174.pdf?arnumber=7930174","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,5]],"date-time":"2017-06-05T18:56:20Z","timestamp":1496688980000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7930174\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,4]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/dtis.2017.7930174","relation":{},"subject":[],"published":{"date-parts":[[2017,4]]}}}