{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T15:22:08Z","timestamp":1730215328379,"version":"3.28.0"},"reference-count":12,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,4,1]],"date-time":"2019-04-01T00:00:00Z","timestamp":1554076800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,4,1]],"date-time":"2019-04-01T00:00:00Z","timestamp":1554076800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,4,1]],"date-time":"2019-04-01T00:00:00Z","timestamp":1554076800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,4]]},"DOI":"10.1109\/dtis.2019.8735075","type":"proceedings-article","created":{"date-parts":[[2019,6,13]],"date-time":"2019-06-13T22:34:52Z","timestamp":1560465292000},"page":"1-6","source":"Crossref","is-referenced-by-count":2,"title":["A Hybrid In-Field Self-Test Technique for SoCs"],"prefix":"10.1109","author":[{"given":"S.","family":"Carbonara","sequence":"first","affiliation":[]},{"given":"P.","family":"Bernardi","sequence":"additional","affiliation":[]},{"given":"M.","family":"Restifo","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1999.805650"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/DFTVS.2005.63"},{"key":"ref10","doi-asserted-by":"crossref","first-page":"88","DOI":"10.1109\/TCAD.2004.839486","article-title":"Effective software-based self-test strategies for on-line periodic testing of embedded processors","volume":"24","author":"paschalis","year":"2005","journal-title":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2015.2498546"},{"key":"ref11","first-page":"107110","article-title":"Infield functional test programs development flow for embedded FPUs","author":"cantoro","year":"2016","journal-title":"2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2017.52"},{"year":"2019","key":"ref12"},{"key":"ref8","doi-asserted-by":"crossref","first-page":"88","DOI":"10.1109\/TCAD.2004.839486","article-title":"Effective software-based self-test strategies for on-line periodic testing of embedded processors","volume":"24","author":"paschalis","year":"2005","journal-title":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/2593069.2602971"},{"journal-title":"ISO\/FDIS 26262 Road vehicles – Functional safety","year":"2011","key":"ref2"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/43.743744"},{"journal-title":"International Electrotechnical Commission","article-title":"International Standard - IEC 61508 - Functional safety of electrical\/electronic\/programmable electronic safety-related systems","year":"2010","key":"ref1"}],"event":{"name":"2019 14th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS)","start":{"date-parts":[[2019,4,16]]},"location":"Mykonos, Greece","end":{"date-parts":[[2019,4,18]]}},"container-title":["2019 14th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8732928\/8734906\/08735075.pdf?arnumber=8735075","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,15]],"date-time":"2022-07-15T03:22:42Z","timestamp":1657855362000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8735075\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,4]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/dtis.2019.8735075","relation":{},"subject":[],"published":{"date-parts":[[2019,4]]}}}