{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T08:13:54Z","timestamp":1725783234830},"reference-count":10,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,4,1]],"date-time":"2020-04-01T00:00:00Z","timestamp":1585699200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,4,1]],"date-time":"2020-04-01T00:00:00Z","timestamp":1585699200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,4,1]],"date-time":"2020-04-01T00:00:00Z","timestamp":1585699200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,4]]},"DOI":"10.1109\/dtis48698.2020.9081288","type":"proceedings-article","created":{"date-parts":[[2020,4,30]],"date-time":"2020-04-30T21:02:13Z","timestamp":1588280533000},"page":"1-6","source":"Crossref","is-referenced-by-count":1,"title":["Improving the reliability of SRAM-based PUFs in the presence of aging"],"prefix":"10.1109","author":[{"given":"P.","family":"Saraza-Canflanca","sequence":"first","affiliation":[]},{"given":"H.","family":"Carrasco-Lopez","sequence":"additional","affiliation":[]},{"given":"P.","family":"Brox","sequence":"additional","affiliation":[]},{"given":"R.","family":"Castro-Lopez","sequence":"additional","affiliation":[]},{"given":"E.","family":"Roca","sequence":"additional","affiliation":[]},{"given":"F.V.","family":"Fernandez","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2012.6224314"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2008.212"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2010.5488856"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ISLPED.2017.8009192"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIFS.2015.2471279"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/SMACD.2018.8434900"},{"key":"ref7","first-page":"1","article-title":"Exploting Power Supply Ramp Rate for Calibrating Cell Strength in SRAM PUFs","author":"wang","year":"2018","journal-title":"IEEE Latin-American Test Symposium (LATS)"},{"key":"ref2","doi-asserted-by":"crossref","first-page":"3","DOI":"10.1007\/978-3-642-14452-3_1","article-title":"Physically Unclonable Functions: A Study on the State of the Art and Future Research Directions","author":"maes","year":"2010","journal-title":"Towards Hardware-Intrinsic Security"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/DSD.2018.00102"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MSSC.2019.2923503"}],"event":{"name":"2020 15th Design & Technology of Integrated Systems in Nanoscale Era (DTIS)","start":{"date-parts":[[2020,4,1]]},"location":"Marrakech, Morocco","end":{"date-parts":[[2020,4,3]]}},"container-title":["2020 15th Design & Technology of Integrated Systems in Nanoscale Era (DTIS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9076568\/9080912\/09081288.pdf?arnumber=9081288","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,27]],"date-time":"2022-06-27T11:49:39Z","timestamp":1656330579000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9081288\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,4]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/dtis48698.2020.9081288","relation":{},"subject":[],"published":{"date-parts":[[2020,4]]}}}