{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,2]],"date-time":"2026-01-02T07:39:51Z","timestamp":1767339591278},"reference-count":14,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,6,28]],"date-time":"2021-06-28T00:00:00Z","timestamp":1624838400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,6,28]],"date-time":"2021-06-28T00:00:00Z","timestamp":1624838400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,6,28]],"date-time":"2021-06-28T00:00:00Z","timestamp":1624838400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,6,28]]},"DOI":"10.1109\/dtis53253.2021.9505101","type":"proceedings-article","created":{"date-parts":[[2021,8,9]],"date-time":"2021-08-09T22:06:49Z","timestamp":1628546809000},"source":"Crossref","is-referenced-by-count":8,"title":["Preliminary Defect Analysis of 8T SRAM Cells for In-Memory Computing Architectures"],"prefix":"10.1109","author":[{"given":"L.","family":"Ammoura","sequence":"first","affiliation":[]},{"given":"M. L.","family":"Flottes","sequence":"additional","affiliation":[]},{"given":"P.","family":"Girard","sequence":"additional","affiliation":[]},{"given":"A.","family":"Virazel","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ETS48528.2020.9131604"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ITC44170.2019.9000117"},{"key":"ref12","article-title":"Defect Characterization and Test Generation for Spintronic-based Compute-In-Memory","author":"nair","year":"2020","journal-title":"Proc IEEE European Test Symposium"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/VALID.2010.19"},{"key":"ref14","author":"bosio","year":"2009","journal-title":"Advanced Test Methods for SRAMs"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2642198"},{"key":"ref3","article-title":"Testing of In-MemoryComputing 8T SRAMs","author":"tsai","year":"2019","journal-title":"Proc IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems"},{"key":"ref6","year":"2019","journal-title":"In-Memory Computing No Fewer than Four Approaches by Bryon Moyer"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1145\/3299874.3317984"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TMSCS.2018.2836967"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/3223047"},{"key":"ref2","article-title":"Testing of Configurable 8T SRAMs for In-Memory Computing","author":"li","year":"2020","journal-title":"Proc IEEE Asian Test Symposium"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2018.2848999"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2018.8342276"}],"event":{"name":"2021 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)","location":"Montpellier, France","start":{"date-parts":[[2021,6,28]]},"end":{"date-parts":[[2021,6,30]]}},"container-title":["2021 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9505031\/9505022\/09505101.pdf?arnumber=9505101","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T15:44:43Z","timestamp":1652197483000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9505101\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,6,28]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/dtis53253.2021.9505101","relation":{},"subject":[],"published":{"date-parts":[[2021,6,28]]}}}