{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,12,14]],"date-time":"2024-12-14T05:16:09Z","timestamp":1734153369098,"version":"3.30.2"},"reference-count":13,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,10,18]],"date-time":"2024-10-18T00:00:00Z","timestamp":1729209600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,10,18]],"date-time":"2024-10-18T00:00:00Z","timestamp":1729209600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,10,18]]},"DOI":"10.1109\/dtpi61353.2024.10778736","type":"proceedings-article","created":{"date-parts":[[2024,12,12]],"date-time":"2024-12-12T19:06:15Z","timestamp":1734030375000},"page":"647-651","source":"Crossref","is-referenced-by-count":0,"title":["A Coupled Electro-Thermal Battery Model Identification and State Estimation Based on Digital Twin"],"prefix":"10.1109","author":[{"given":"Yuan","family":"Zhu","sequence":"first","affiliation":[{"name":"Beihang University,School of Automation Science and Electrical Engineering,Beijing,China"}]},{"given":"Xiangyang","family":"Zhao","sequence":"additional","affiliation":[{"name":"Beihang University,School of Automation Science and Electrical Engineering,Beijing,China"}]},{"given":"Linze","family":"Yang","sequence":"additional","affiliation":[{"name":"Beihang University,School of Automation Science and Electrical Engineering,Beijing,China"}]},{"given":"Junben","family":"Huang","sequence":"additional","affiliation":[{"name":"Beihang University,School of Automation Science and Electrical Engineering,Beijing,China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2014.2317451"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.3390\/app8050659"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.est.2021.103023"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2018.2873186"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.egyai.2020.100016"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ICPHYS.2019.8780347"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1186\/s10033-021-00577-0"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.electacta.2017.10.153"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1149\/1.1393490"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2014.01.097"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.est.2020.101557"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.3390\/systems7010007"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1149\/1.2113792"}],"event":{"name":"2024 IEEE 4th International Conference on Digital Twins and Parallel Intelligence (DTPI)","start":{"date-parts":[[2024,10,18]]},"location":"Wuhan, China","end":{"date-parts":[[2024,10,20]]}},"container-title":["2024 IEEE 4th International Conference on Digital Twins and Parallel Intelligence (DTPI)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10778636\/10778638\/10778736.pdf?arnumber=10778736","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,12,13]],"date-time":"2024-12-13T07:02:49Z","timestamp":1734073369000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10778736\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,10,18]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/dtpi61353.2024.10778736","relation":{},"subject":[],"published":{"date-parts":[[2024,10,18]]}}}