{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,16]],"date-time":"2026-03-16T03:13:59Z","timestamp":1773630839357,"version":"3.50.1"},"reference-count":34,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,10,14]],"date-time":"2024-10-14T00:00:00Z","timestamp":1728864000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,10,14]],"date-time":"2024-10-14T00:00:00Z","timestamp":1728864000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,10,14]]},"DOI":"10.1109\/dttis62212.2024.10780418","type":"proceedings-article","created":{"date-parts":[[2024,12,13]],"date-time":"2024-12-13T18:49:01Z","timestamp":1734115741000},"page":"1-6","source":"Crossref","is-referenced-by-count":2,"title":["Embedded Feature Selection in MCU Performance Screening"],"prefix":"10.1109","author":[{"given":"Nicol\u00f2","family":"Bellarmino","sequence":"first","affiliation":[{"name":"Politecnico di Torino,Torino,Italy"}]},{"given":"Riccardo","family":"Cantoro","sequence":"additional","affiliation":[{"name":"Politecnico di Torino,Torino,Italy"}]},{"given":"Martin","family":"Huch","sequence":"additional","affiliation":[{"name":"Infineon Technologies AG,Munich,Germany"}]},{"given":"Tobias","family":"Kilian","sequence":"additional","affiliation":[{"name":"Infineon Technologies AG,Munich,Germany"}]},{"given":"Ulf","family":"Schlichtmann","sequence":"additional","affiliation":[{"name":"Technical University of Munich,Munich,Germany"}]},{"given":"Giovanni","family":"Squillero","sequence":"additional","affiliation":[{"name":"Politecnico di Torino,Torino,Italy"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS56730.2022.9897769"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ITC44778.2020.9325253"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ETS50041.2021.9465472"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2023.3245989"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2009.5355620"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2010.5469604"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2016.2602806"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/LATS58125.2023.10154495"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2007.4418979"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2018.2810954"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2012.6187559"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2012.6401560"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/43.986428"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2007.907232"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/66.29679"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1007\/s40747-021-00637-x"},{"key":"ref17","article-title":"An Introduction to Variable and Feature Selection","author":"Guyon","year":"2003","journal-title":"The Journal of Machine Learning Research"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.mejo.2015.09.014"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/MDAT.2014.2361722"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.jksuci.2019.06.012"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1098\/rsta.2015.0202"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2009.53"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1007\/978-4-431-56594-9"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1515\/9781400874668"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/IC2IE50715.2020.9274570"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1023\/A:1012487302797"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1023\/A:1010933404324"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1111\/j.2517-6161.1996.tb02080.x"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1111\/j.1467-9868.2005.00527.x"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.2007.909108"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/JSTARS.2021.3069013"},{"key":"ref32","author":"He","year":"2019","journal-title":"Gradient Boosting Machine: A Survey"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.5194\/gmd-7-1247-2014"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.7717\/peerj-cs.623"}],"event":{"name":"2024 IEEE International Conference on Design, Test and Technology of Integrated Systems (DTTIS)","location":"Aix-EN-PROVENCE, France","start":{"date-parts":[[2024,10,14]]},"end":{"date-parts":[[2024,10,16]]}},"container-title":["2024 IEEE International Conference on Design, Test and Technology of Integrated Systems (DTTIS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10779589\/10779988\/10780418.pdf?arnumber=10780418","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,12,14]],"date-time":"2024-12-14T06:48:27Z","timestamp":1734158907000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10780418\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,10,14]]},"references-count":34,"URL":"https:\/\/doi.org\/10.1109\/dttis62212.2024.10780418","relation":{},"subject":[],"published":{"date-parts":[[2024,10,14]]}}}