{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T15:21:33Z","timestamp":1730215293803,"version":"3.28.0"},"reference-count":15,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,6,1]],"date-time":"2019-06-01T00:00:00Z","timestamp":1559347200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,6,1]],"date-time":"2019-06-01T00:00:00Z","timestamp":1559347200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,6,1]],"date-time":"2019-06-01T00:00:00Z","timestamp":1559347200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,6]]},"DOI":"10.1109\/ecai46879.2019.9042159","type":"proceedings-article","created":{"date-parts":[[2020,4,24]],"date-time":"2020-04-24T01:19:20Z","timestamp":1587691160000},"page":"1-5","source":"Crossref","is-referenced-by-count":8,"title":["A deep CNN for Image Analytics in Automated Manufacturing Process Control"],"prefix":"10.1109","author":[{"given":"Manuella","family":"Kadar","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Daniela","family":"Onita","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1155\/2017\/5067651"},{"key":"ref11","article-title":"Gear classification for defect detection in vision Inspection system using deep convolutional neural networks","volume":"9","author":"kamal","year":"2018","journal-title":"ICIC Express Letters Part B Applications ICIC International"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/BigData.2017.8258115"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ISFA.2016.7790137"},{"key":"ref14","article-title":"Adam: A method for stochastic optimization","author":"diederik","year":"2014","journal-title":"ArXiv Preprint"},{"journal-title":"Deep Learning with Python","year":"2017","author":"brownlee","key":"ref15"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.5565\/rev\/elcvia.268"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijpe.2014.04.018"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1155\/S1110865702203145"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1186\/1687-5281-2014-50"},{"key":"ref8","doi-asserted-by":"crossref","first-page":"303","DOI":"10.1007\/s40684-016-0039-x","article-title":"Machine learning based imaging system for surface defect inspection","volume":"3","author":"mark","year":"2016","journal-title":"Int J Precis Eng Manuf -Green Technol"},{"key":"ref7","first-page":"1","article-title":"Steel defect classification with max-pooling convolution neural networks","volume":"20","author":"masci","year":"0","journal-title":"IEEE International Joint Conference on Neural Networks (IJCNN)"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmsy.2018.01.003"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/5.726791"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.jsv.2016.05.027"}],"event":{"name":"2019 11th International Conference on Electronics, Computers and Artificial Intelligence (ECAI)","start":{"date-parts":[[2019,6,27]]},"location":"Pitesti, Romania","end":{"date-parts":[[2019,6,29]]}},"container-title":["2019 11th International Conference on Electronics, Computers and Artificial Intelligence (ECAI)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9033451\/9041922\/09042159.pdf?arnumber=9042159","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,19]],"date-time":"2022-07-19T20:24:36Z","timestamp":1658262276000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9042159\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,6]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/ecai46879.2019.9042159","relation":{},"subject":[],"published":{"date-parts":[[2019,6]]}}}