{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,25]],"date-time":"2026-07-25T05:02:41Z","timestamp":1784955761253,"version":"3.55.0"},"reference-count":28,"publisher":"IEEE","license":[{"start":{"date-parts":[[2026,7,1]],"date-time":"2026-07-01T00:00:00Z","timestamp":1782864000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2026,7,1]],"date-time":"2026-07-01T00:00:00Z","timestamp":1782864000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,7,1]],"date-time":"2026-07-01T00:00:00Z","timestamp":1782864000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2026,7]]},"DOI":"10.1109\/ecai69016.2026.11613771","type":"proceedings-article","created":{"date-parts":[[2026,7,24]],"date-time":"2026-07-24T19:12:08Z","timestamp":1784920328000},"page":"1-5","source":"Crossref","is-referenced-by-count":0,"title":["Simulation-Based Analysis of Current Stress and State of Charge Divergence in 2P2S Battery Configurations under Aging Effects"],"prefix":"10.1109","author":[{"given":"Seda","family":"Yildirim","sequence":"first","affiliation":[{"name":"Bursa Technical University","place":["Bursa, T\u00fcrkiye"],"department":["Dept. of Electrical and Electronics Engineering"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"G\u00fcrkan","family":"Aydemir","sequence":"additional","affiliation":[{"name":"Bursa Technical University","place":["Bursa, T\u00fcrkiye"],"department":["Dept. of Electrical and Electronics Engineering"]}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.est.2025.119694"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.rser.2015.07.010"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.rser.2017.05.001"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.jclepro.2015.11.011"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1155\/2022\/3379574"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1002\/wene.507"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/access.2023.3318121"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/s12667-023-00631-x"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.energy.2023.127424"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2016.02.087"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.est.2019.100781"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.apenergy.2025.127122"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.apenergy.2025.127122"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1039\/d5eb00103j"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.3390\/en14164716"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.est.2019.100781"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.est.2021.103252"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2016.03.042"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1149\/1945-7111\/ae33fc"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.3390\/en10111766"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/access.2023.3244801"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.est.2022.104061"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.3390\/en14144074"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.62146\/ijecbe.v3i1.99"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.apenergy.2008.11.021"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/epec47565.2019.9074781"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/tvt.2019.2929653"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/incae.2018.8579414"}],"event":{"name":"2026 18th International Conference on Electronics, Computers and Artificial Intelligence (ECAI)","location":"Bucharest, Romania","start":{"date-parts":[[2026,7,2]]},"end":{"date-parts":[[2026,7,3]]}},"container-title":["2026 18th International Conference on Electronics, Computers and Artificial Intelligence (ECAI)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11613560\/11613162\/11613771.pdf?arnumber=11613771","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,7,25]],"date-time":"2026-07-25T04:41:36Z","timestamp":1784954496000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11613771\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,7]]},"references-count":28,"URL":"https:\/\/doi.org\/10.1109\/ecai69016.2026.11613771","relation":{},"subject":[],"published":{"date-parts":[[2026,7]]}}}