{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T15:32:30Z","timestamp":1730215950451,"version":"3.28.0"},"reference-count":11,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/ecctd.2005.1522926","type":"proceedings-article","created":{"date-parts":[[2006,10,11]],"date-time":"2006-10-11T11:51:59Z","timestamp":1160567519000},"page":"127-130","source":"Crossref","is-referenced-by-count":2,"title":["6 bit 1 GHz CMOS silicon-on-insulator flash analog-to-digital converter for read channel applications"],"prefix":"10.1109","volume":"1","author":[{"given":"E.","family":"Sall","sequence":"first","affiliation":[]},{"given":"M.","family":"Vesterbacka","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","first-page":"5","article-title":"New encoding scheme for high-speed flash ADC's","volume":"1","author":"kaess","year":"1997","journal-title":"Proc IEEE Circuits Syst"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2003.813244"},{"key":"10","article-title":"A 6b 1.6GSamples\/s flash ADC in 0.18?m CMOS using averaging termination","author":"scheltend","year":"2002","journal-title":"IEEE Int Solid-State Circuits Conf"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/IWSOC.2004.1319884"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/4.545804"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/TENCON.2004.1414916"},{"key":"5","first-page":"361","article-title":"Challenges for ultra-wideband (UWB) CMOS integration","author":"aiello","year":"2003","journal-title":"IEEE MTT-S Digest"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4615-2748-0"},{"key":"9","first-page":"128","article-title":"A 6b 1.1GSamples\/s CMOS A\/D converter","author":"geelen","year":"2001","journal-title":"IEEE Int Solid-State Circuits Conf"},{"key":"8","first-page":"79","article-title":"Designer's guide to flash-ADC testing - Part 2: DSP test techniques keep flash ADCs in check","author":"kester","year":"0","journal-title":"Analog Devices Application Note 215B"},{"key":"11","first-page":"339","article-title":"A 6bit, 1.2GSps low-power flash-ADC in 0.13?m digital CMOS","author":"sandner","year":"2005","journal-title":"Proc Design Aut and Test Conf"}],"event":{"name":"2005 European Conference on Circuit Theory and Design, 2005.","location":"Cork, Ireland"},"container-title":["Proceedings of the 2005 European Conference on Circuit Theory and Design, 2005."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/10211\/32578\/01522926.pdf?arnumber=1522926","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,14]],"date-time":"2017-03-14T20:39:54Z","timestamp":1489523994000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1522926\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/ecctd.2005.1522926","relation":{},"subject":[]}}