{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,4,30]],"date-time":"2025-04-30T20:40:06Z","timestamp":1746045606387,"version":"3.28.0"},"reference-count":8,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2011,8]]},"DOI":"10.1109\/ecctd.2011.6043816","type":"proceedings-article","created":{"date-parts":[[2011,10,13]],"date-time":"2011-10-13T16:55:12Z","timestamp":1318524912000},"page":"885-888","source":"Crossref","is-referenced-by-count":4,"title":["A BIST scheme for operational amplifier by checking the stable output of transient response"],"prefix":"10.1109","author":[{"family":"Yuan Jun","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Tachibana","family":"Masayoshi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1049\/el:19920924"},{"key":"ref3","first-page":"1012?1","article-title":"A digital BIST for Op Amps embedded in mixed-signal circuits by analyzing the transient response","author":"font-rossello","year":"2002","journal-title":"Fourth IEEE International Caracas Conference on Devices Circuits and Systems Aruba"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1023\/A:1021280302991"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/4.663562"},{"key":"ref8","first-page":"428","article-title":"A Compact On-Chip Testing Scheme for Analog-Mixed Signal Systems Using Two-Step AC and DC Faults Signature Characterizations","author":"san-urn","year":"2009","journal-title":"SASIMI'2009"},{"key":"ref7","first-page":"269","volume":"2","author":"allen","year":"2002","journal-title":"CMOS Analog Circuit Design"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/EDTC.1995.470425"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1999.766680"}],"event":{"name":"2011 European Conference on Circuit Theory and Design (ECCTD)","start":{"date-parts":[[2011,8,29]]},"location":"Linkoping, Sweden","end":{"date-parts":[[2011,8,31]]}},"container-title":["2011 20th European Conference on Circuit Theory and Design (ECCTD)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6033674\/6043284\/06043816.pdf?arnumber=6043816","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,20]],"date-time":"2017-03-20T21:28:49Z","timestamp":1490045329000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6043816\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,8]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/ecctd.2011.6043816","relation":{},"subject":[],"published":{"date-parts":[[2011,8]]}}}