{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,29]],"date-time":"2026-04-29T09:21:27Z","timestamp":1777454487991,"version":"3.51.4"},"reference-count":13,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2012,5]]},"DOI":"10.1109\/eit.2012.6220742","type":"proceedings-article","created":{"date-parts":[[2012,6,29]],"date-time":"2012-06-29T15:12:07Z","timestamp":1340982727000},"page":"1-6","source":"Crossref","is-referenced-by-count":1,"title":["Optimal device for a low output impedance voltage source for Electrical Impedance Tomography (EIT) systems"],"prefix":"10.1109","author":[{"given":"T","family":"Qureshi","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"B","family":"Mehboob","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"C R","family":"Chatwin","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"W","family":"Wang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"13","doi-asserted-by":"publisher","DOI":"10.1088\/1742-6596\/224\/1\/012160"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/TBME.2007.903516"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1088\/1742-6596\/224\/1\/012167"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/10.817619"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1111\/j.1749-6632.1999.tb09446.x"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1088\/0967-3334\/19\/1\/006"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-73841-1_57"},{"key":"7","doi-asserted-by":"crossref","DOI":"10.1088\/0967-3334\/27\/5\/S19","article-title":"A high-precision voltage source for EIT","volume":"27","author":"saulnier","year":"2006","journal-title":"Physiological Measurement"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1088\/0967-3334\/25\/1\/041"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1088\/0967-3334\/24\/2\/361"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1088\/0967-3334\/22\/1\/304"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1088\/0967-3334\/28\/10\/004"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/IEMBS.2007.4353251"}],"event":{"name":"2012 IEEE International Conference on Electro\/Information Technology (EIT 2012)","location":"Indianapolis, IN, USA","start":{"date-parts":[[2012,5,6]]},"end":{"date-parts":[[2012,5,8]]}},"container-title":["2012 IEEE International Conference on Electro\/Information Technology"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6213588\/6220603\/06220742.pdf?arnumber=6220742","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,20]],"date-time":"2017-06-20T16:46:19Z","timestamp":1497977179000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6220742\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,5]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/eit.2012.6220742","relation":{},"subject":[],"published":{"date-parts":[[2012,5]]}}}