{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T16:12:10Z","timestamp":1730218330655,"version":"3.28.0"},"reference-count":13,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2014,6]]},"DOI":"10.1109\/eit.2014.6871777","type":"proceedings-article","created":{"date-parts":[[2014,8,18]],"date-time":"2014-08-18T17:03:43Z","timestamp":1408381423000},"page":"280-283","source":"Crossref","is-referenced-by-count":0,"title":["FPGA interconnect modeling for lifetime failure detection"],"prefix":"10.1109","author":[{"given":"Kavya","family":"Vittala","sequence":"first","affiliation":[]},{"given":"Srinivasa","family":"Vemuru","sequence":"additional","affiliation":[]},{"given":"Mohammed","family":"Niamat","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2006.884077"},{"key":"11","article-title":"BIST to diagnosis delay fault in the LUT of cluster based FPGA","volume":"2","author":"das","year":"2012","journal-title":"International Journal of Information and Electronics Engineering"},{"journal-title":"Predictive Technology Model","year":"0","key":"12"},{"journal-title":"A Tutorial on FPGA Routing","year":"2006","author":"gomez-prado","key":"3"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1998.743180"},{"journal-title":"International Technology Roadmap for Semiconductors","year":"0","key":"1"},{"key":"10","article-title":"Design-specific path delay testing in lookup table-based FPGAs","author":"menon","year":"2005","journal-title":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1007\/s11265-007-0141-y"},{"journal-title":"Global Interconnects in the Presence of Uncertainty","year":"2008","author":"benito","key":"6"},{"journal-title":"The Future Looks Gloomy for FPGA Interconnects","year":"2009","author":"mak","key":"5"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2007.896319"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2008.927212"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.1999.777267"}],"event":{"name":"2014 IEEE International Conference on Electro\/Information Technology (EIT)","start":{"date-parts":[[2014,6,5]]},"location":"Milwaukee, WI, USA","end":{"date-parts":[[2014,6,7]]}},"container-title":["IEEE International Conference on Electro\/Information Technology"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6863137\/6871745\/06871777.pdf?arnumber=6871777","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,23]],"date-time":"2017-03-23T18:44:39Z","timestamp":1490294679000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6871777\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,6]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/eit.2014.6871777","relation":{},"subject":[],"published":{"date-parts":[[2014,6]]}}}