{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T16:13:24Z","timestamp":1730218404999,"version":"3.28.0"},"reference-count":10,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,5]]},"DOI":"10.1109\/eit.2017.8053393","type":"proceedings-article","created":{"date-parts":[[2017,10,2]],"date-time":"2017-10-02T20:24:45Z","timestamp":1506975885000},"page":"394-397","source":"Crossref","is-referenced-by-count":0,"title":["Analysis of library functions for FPGA compute accelerators"],"prefix":"10.1109","author":[{"given":"Spenser","family":"Gilliland","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jafar","family":"Saniie","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Fernando Martinez","family":"Vallina","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/EIT.2016.7535235"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2011.2110592"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/NORCHIP.2016.7792907"},{"key":"ref6","first-page":"8","article-title":"The opencl specification","volume":"1","author":"group","year":"2008","journal-title":"Version"},{"journal-title":"(2016 December) Google test Google","year":"0","key":"ref5"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2017.2671881"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/IPDPSW.2016.171"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1145\/275107.275139"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/1057600.1057602"},{"journal-title":"iso\/iec 9899 1999 (e) contents","year":"0","key":"ref1"}],"event":{"name":"2017 IEEE International Conference on Electro Information Technology (EIT)","start":{"date-parts":[[2017,5,14]]},"location":"Lincoln, NE, USA","end":{"date-parts":[[2017,5,17]]}},"container-title":["2017 IEEE International Conference on Electro Information Technology (EIT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8039355\/8053318\/08053393.pdf?arnumber=8053393","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,10,27]],"date-time":"2017-10-27T21:35:50Z","timestamp":1509140150000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8053393\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,5]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/eit.2017.8053393","relation":{},"subject":[],"published":{"date-parts":[[2017,5]]}}}