{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,21]],"date-time":"2025-10-21T15:31:36Z","timestamp":1761060696070,"version":"3.28.0"},"reference-count":15,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,5]]},"DOI":"10.1109\/eit.2018.8500264","type":"proceedings-article","created":{"date-parts":[[2018,11,15]],"date-time":"2018-11-15T23:48:00Z","timestamp":1542325680000},"page":"0404-0410","source":"Crossref","is-referenced-by-count":12,"title":["Fault Detection and Localization in Solar Photovoltaic Arrays Framework: Hybrid Methods of Data-Analysis and a Network of Voltage-Current Sensors"],"prefix":"10.1109","author":[{"given":"Masoud","family":"Alajmi","sequence":"first","affiliation":[]},{"given":"Osama","family":"Aljasem","sequence":"additional","affiliation":[]},{"given":"Niaz","family":"Ali","sequence":"additional","affiliation":[]},{"given":"Adnan","family":"Alqurashi","sequence":"additional","affiliation":[]},{"given":"Ikhlas","family":"Abdel-Qader","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1049\/joe.2017.0567"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ICASSP.2012.6288220"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1049\/hve.2017.0044"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/EIT.2016.7535257"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/APPEEC.2011.5747701"},{"key":"ref15","first-page":"3891","article-title":"Research on PV module structure based on fault detection","author":"liu","year":"2010","journal-title":"2010 Chinese Control Decis Conf"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/PVSC.2012.6318250"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1002\/pip.490"},{"key":"ref6","first-page":"1","article-title":"Hot spot Risk analysis on silicon cell modules","volume":"49","author":"wendlandt","year":"2010","journal-title":"25th EU PVSEC"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JPHOTOV.2016.2581478"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/PVSC.2005.1488317"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/PVSC.1990.111730"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/S0038-092X(96)00066-7"},{"key":"ref1","first-page":"2806","article-title":"Investigation of reverse current for crystalline silicon solar cells New concept for a test standard about the reverse current","author":"yang","year":"2005","journal-title":"Proc 35th IEEE Photovoltaic Spec Conf (PVSC)"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/PVSC.2008.4922843"}],"event":{"name":"2018 IEEE International Conference on Electro\/Information Technology (EIT)","start":{"date-parts":[[2018,5,3]]},"location":"Rochester, MI","end":{"date-parts":[[2018,5,5]]}},"container-title":["2018 IEEE International Conference on Electro\/Information Technology (EIT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8482102\/8500077\/08500264.pdf?arnumber=8500264","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,8,24]],"date-time":"2020-08-24T03:58:03Z","timestamp":1598241483000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8500264\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,5]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/eit.2018.8500264","relation":{},"subject":[],"published":{"date-parts":[[2018,5]]}}}