{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T16:14:56Z","timestamp":1730218496561,"version":"3.28.0"},"reference-count":17,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,5]]},"DOI":"10.1109\/eit.2018.8500293","type":"proceedings-article","created":{"date-parts":[[2018,11,12]],"date-time":"2018-11-12T19:15:06Z","timestamp":1542050106000},"page":"0203-0208","source":"Crossref","is-referenced-by-count":2,"title":["A Theoretical Analysis on the Reliability of Multigenerational IoT"],"prefix":"10.1109","author":[{"given":"Xianping","family":"Wang","sequence":"first","affiliation":[]},{"given":"Stephan","family":"Olariu","sequence":"additional","affiliation":[]},{"given":"Hao","family":"Qiu","sequence":"additional","affiliation":[]},{"given":"Fei","family":"Xie","sequence":"additional","affiliation":[]},{"given":"Anthony","family":"Choi","sequence":"additional","affiliation":[]},{"given":"Wenbing","family":"Zhao","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.3390\/asi1010003"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/EIT.2016.7535241"},{"journal-title":"Towards aggregating time-discounted information in sensor networks","year":"2016","author":"wang","key":"ref12"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1145\/2581555.2581569"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/NCA.2013.35"},{"key":"ref15","first-page":"892","article-title":"Semi-supervised learning","author":"zhu","year":"2011","journal-title":"Encyclopedia of Machine Learning"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TPDS.2011.165"},{"key":"ref17","volume":"769","author":"singh","year":"1977","journal-title":"System Reliability Modelling and Evaluation"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TITS.2016.2547340"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/MILCOM.2014.189"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1515\/jaiscr-2015-0014"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/DASC-PICom-DataCom-CyberSciTec.2017.64"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/THMS.2016.2611825"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.3390\/app7111176"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/COMST.2018.2803740"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/UEMCON.2017.8249015"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/SMC.2017.8123185"}],"event":{"name":"2018 IEEE International Conference on Electro\/Information Technology (EIT)","start":{"date-parts":[[2018,5,3]]},"location":"Rochester, MI","end":{"date-parts":[[2018,5,5]]}},"container-title":["2018 IEEE International Conference on Electro\/Information Technology (EIT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8482102\/8500077\/08500293.pdf?arnumber=8500293","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,8,23]],"date-time":"2020-08-23T23:58:53Z","timestamp":1598227133000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8500293\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,5]]},"references-count":17,"URL":"https:\/\/doi.org\/10.1109\/eit.2018.8500293","relation":{},"subject":[],"published":{"date-parts":[[2018,5]]}}}