{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,19]],"date-time":"2025-03-19T11:51:25Z","timestamp":1742385085723},"reference-count":19,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,7,1]],"date-time":"2020-07-01T00:00:00Z","timestamp":1593561600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,7,1]],"date-time":"2020-07-01T00:00:00Z","timestamp":1593561600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,7,1]],"date-time":"2020-07-01T00:00:00Z","timestamp":1593561600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,7]]},"DOI":"10.1109\/eit48999.2020.9208308","type":"proceedings-article","created":{"date-parts":[[2020,9,29]],"date-time":"2020-09-29T22:14:04Z","timestamp":1601417644000},"source":"Crossref","is-referenced-by-count":4,"title":["Visualizing and Predicting Culex Tarsalis Trapcounts for West Nile Virus (WNV) Disease Incidence using Machine Learning Models"],"prefix":"10.1109","author":[{"given":"Radhakrishnan Angamuthu","family":"Chinnathambi","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Alex","family":"Marquette","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Tyler","family":"Clark","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Aaron","family":"Johnson","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Daisy Flora","family":"Selvaraj","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jeff","family":"Vaughan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Todd","family":"Hanson","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Scott","family":"Hanson","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Prakash","family":"Ranganathan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Naima","family":"Kaabouch","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/S1474-4422(07)70030-3"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/FTC.2016.7821628"},{"key":"ref12","first-page":"310","article-title":"Predicting west nile virus (wnv) occurrences in north dakota using data mining techniques","year":"0","journal-title":"2016 Future Technologies Conference (FTC) FTC"},{"key":"ref13","year":"0"},{"key":"ref14","year":"0"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4614-6849-3"},{"key":"ref16","author":"lantz","year":"2019","journal-title":"Machine Learning with R Expert Techniques for Predictive Modeling"},{"key":"ref17","year":"0"},{"key":"ref18","year":"0"},{"key":"ref19","year":"0"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1089\/vbz.2005.5.373"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1097\/NHH.0000000000000230"},{"key":"ref6","author":"carpenter","year":"1974","journal-title":"Mosquitoes of North America (North of Mexico)"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1089\/vbz.2007.0137"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1126\/science.286.5448.2333"},{"key":"ref7","year":"0"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/S1473-3099(02)00368-7"},{"key":"ref1","author":"nriagu","year":"2019","journal-title":"Encyclopedia of Environmental Health"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/B978-0-12-801238-3.02696-9"}],"event":{"name":"2020 IEEE International Conference on Electro Information Technology (EIT)","location":"Chicago, IL, USA","start":{"date-parts":[[2020,7,31]]},"end":{"date-parts":[[2020,8,1]]}},"container-title":["2020 IEEE International Conference on Electro Information Technology (EIT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9200885\/9208231\/09208308.pdf?arnumber=9208308","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,27]],"date-time":"2022-06-27T16:14:14Z","timestamp":1656346454000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9208308\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,7]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/eit48999.2020.9208308","relation":{},"subject":[],"published":{"date-parts":[[2020,7]]}}}