{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,6]],"date-time":"2025-11-06T06:18:14Z","timestamp":1762409894087,"version":"3.37.3"},"reference-count":15,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,5,14]],"date-time":"2021-05-14T00:00:00Z","timestamp":1620950400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,5,14]],"date-time":"2021-05-14T00:00:00Z","timestamp":1620950400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,5,14]],"date-time":"2021-05-14T00:00:00Z","timestamp":1620950400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100006147","name":"Office of Nuclear Energy","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100006147","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,5,14]]},"DOI":"10.1109\/eit51626.2021.9491844","type":"proceedings-article","created":{"date-parts":[[2021,7,27]],"date-time":"2021-07-27T01:21:10Z","timestamp":1627348870000},"page":"209-214","source":"Crossref","is-referenced-by-count":7,"title":["Spatial Temporal Denoised Thermal Source Separation in Images of Compact Pulsed Thermography System for Qualification of Additively Manufactured Metals"],"prefix":"10.1109","author":[{"given":"Xin","family":"Zhang","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jafar","family":"Saniie","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Alexander","family":"Heifetz","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","article-title":"Thermographic image processing for NDT","author":"ibarra-castanedo","year":"2007","journal-title":"IV Conferencia Panamericana de END"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/s11837-020-04408-w"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/s10921-019-0559-8"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.4236\/jsip.2017.82007"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1021\/ac00205a007"},{"key":"ref15","article-title":"The Fixed-Point Algorithm and Maximum Likelihood Estimation for Independent Component Analysis","volume":"10","author":"hyv\u00e4rinen","year":"1999","journal-title":"J Neural Processing Letters"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1063\/5.0016222"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.actamat.2016.02.014"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/IUS46767.2020.9251734"},{"key":"ref5","article-title":"ICME Approach to Determining Critical Pore Size of IN718 Produced by Selective Laser Melting","volume":"72","author":"sangid","year":"2019","journal-title":"JOM"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/EIT48999.2020.9208337"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/s11837-020-04428-6"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/s11837-019-03607-4"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.addma.2020.101453"},{"key":"ref9","doi-asserted-by":"crossref","DOI":"10.2172\/1725820","article-title":"Second Annual Progress Report on Pulsed Thermal Tomography Nondestructive Examination of Additively Manufactured Reactor Materials","author":"heifetz","year":"2020"}],"event":{"name":"2021 IEEE International Conference on Electro Information Technology (EIT)","start":{"date-parts":[[2021,5,14]]},"location":"Mt. Pleasant, MI, USA","end":{"date-parts":[[2021,5,15]]}},"container-title":["2021 IEEE International Conference on Electro Information Technology (EIT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9491850\/9491831\/09491844.pdf?arnumber=9491844","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,1,5]],"date-time":"2023-01-05T15:26:36Z","timestamp":1672932396000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9491844\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,5,14]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/eit51626.2021.9491844","relation":{},"subject":[],"published":{"date-parts":[[2021,5,14]]}}}