{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T16:16:55Z","timestamp":1730218615442,"version":"3.28.0"},"reference-count":15,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,5,19]],"date-time":"2022-05-19T00:00:00Z","timestamp":1652918400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,5,19]],"date-time":"2022-05-19T00:00:00Z","timestamp":1652918400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,5,19]]},"DOI":"10.1109\/eit53891.2022.9813795","type":"proceedings-article","created":{"date-parts":[[2022,7,7]],"date-time":"2022-07-07T19:32:19Z","timestamp":1657222339000},"page":"342-345","source":"Crossref","is-referenced-by-count":0,"title":["Using Metamorphic Relationships and Genetic Algorithms to Test Open-Source Software"],"prefix":"10.1109","author":[{"given":"Alex","family":"Billedeaux","sequence":"first","affiliation":[{"name":"Grand Valley State University,School of Computing,Allendale,Michigan"}]},{"given":"Byron","family":"DeVries","sequence":"additional","affiliation":[{"name":"Grand Valley State University,School of Computing,Allendale,Michigan"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"crossref","first-page":"805","DOI":"10.1109\/TSE.2016.2532875","article-title":"A survey on metamorphic testing","volume":"42","author":"segura","year":"2016","journal-title":"IEEE Transactions on Software Engineering"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2014.2372785"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ICST.2013.13"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1145\/3387940.3392251"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1145\/3387940.3392253"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/SBST52555.2021.00008"},{"key":"ref4","article-title":"Metamorphic testing: a new approach for generating next test cases. technical report hkust-cs98-01","author":"chen","year":"1998","journal-title":"The Hong Kong University of Science Technology"},{"key":"ref3","article-title":"Metamorphic testing: Testing the untestable","author":"segura","year":"2018","journal-title":"IEEE Software"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.7551\/mitpress\/3927.001.0001"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1145\/3143561"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/MET52542.2021.00014"},{"key":"ref7","first-page":"1","article-title":"Simulated binary crossover for continuous search space","volume":"9","author":"deb","year":"1994","journal-title":"Complex Systems"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1201\/9781003168447"},{"key":"ref1","first-page":"27","article-title":"Tools for coverage testing: necessary but not sufficient","volume":"20","author":"gaffney","year":"2004","journal-title":"Journal of Computing Sciences in Colleges"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/MET52542.2021.00017"}],"event":{"name":"2022 IEEE International Conference on Electro Information Technology (eIT)","start":{"date-parts":[[2022,5,19]]},"location":"Mankato, MN, USA","end":{"date-parts":[[2022,5,21]]}},"container-title":["2022 IEEE International Conference on Electro Information Technology (eIT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9813697\/9813750\/09813795.pdf?arnumber=9813795","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,8,5]],"date-time":"2022-08-05T00:45:02Z","timestamp":1659660302000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9813795\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,5,19]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/eit53891.2022.9813795","relation":{},"subject":[],"published":{"date-parts":[[2022,5,19]]}}}