{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,29]],"date-time":"2025-05-29T05:03:41Z","timestamp":1748495021779,"version":"3.37.3"},"reference-count":34,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,5,18]],"date-time":"2023-05-18T00:00:00Z","timestamp":1684368000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,5,18]],"date-time":"2023-05-18T00:00:00Z","timestamp":1684368000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,5,18]]},"DOI":"10.1109\/eit57321.2023.10187342","type":"proceedings-article","created":{"date-parts":[[2023,7,25]],"date-time":"2023-07-25T17:22:40Z","timestamp":1690305760000},"page":"1-5","source":"Crossref","is-referenced-by-count":4,"title":["Deep Learning Application for Detection of Malaria"],"prefix":"10.1109","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-7247-5564","authenticated-orcid":false,"given":"Md Saifur","family":"Rahman","sequence":"first","affiliation":[{"name":"University of Minnesota Crookston,Dept. of Math, Science and Technology,Crookston,MN,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5011-2778","authenticated-orcid":false,"given":"Nafiz","family":"Rifat","sequence":"additional","affiliation":[{"name":"North Dakota State University,Dept. of Computer Science,Fargo,ND,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1748-5652","authenticated-orcid":false,"given":"Mostofa","family":"Ahsan","sequence":"additional","affiliation":[{"name":"North Dakota State University,Dept. of Computer Science,Fargo,ND,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sabrina","family":"Islam","sequence":"additional","affiliation":[{"name":"Florida Atlantic University,Dept. of Biological Sciences,Boca Raton,FL,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0145-6838","authenticated-orcid":false,"given":"Md.","family":"Chowdhury","sequence":"additional","affiliation":[{"name":"East Stroudsburg University,Dept. of Computer Science,East Stroudsburg,PA,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5377-8196","authenticated-orcid":false,"given":"Rahul","family":"Gomes","sequence":"additional","affiliation":[{"name":"University of Wisconsin-Eau Claire,Dept. of Computer Science,Eau Claire,WI,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1007\/BF00994018"},{"key":"ref12","first-page":"19","article-title":"Machine learning within a con resistant trust model","author":"chowdhury","year":"0","journal-title":"The 33rd International Conference on Computers and their Applications (CATA 2018)"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2009.5206848"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/EIT.2018.8500111"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1023\/A:1010933404324"},{"key":"ref31","article-title":"Grad-cam: Why did you say that?","author":"selvaraju","year":"2016","journal-title":"ArXiv Preprint"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.90"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.5815\/ijieeb.2022.02.01"},{"key":"ref33","doi-asserted-by":"crossref","first-page":"321","DOI":"10.1613\/jair.953","article-title":"Smote: synthetic minority over-sampling technique","volume":"16","author":"chawla","year":"2002","journal-title":"Journal of Artificial Intelligence Research"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.3390\/jcp1010011"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/EIT.2018.8500086"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1186\/s40101-020-00251-9"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1128\/JCM.43.1.528.2005"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1145\/2939672.2939785"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.1985.6313426"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.18046\/syt.v10i20.1151"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1155\/2022\/3922763"},{"journal-title":"Malaria datasheet","year":"0","key":"ref24"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.3390\/app11052284"},{"key":"ref26","article-title":"Very deep convolutional networks for large-scale image recognition","author":"simonyan","year":"2014","journal-title":"ArXiv Preprint"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/eIT53891.2022.9814006"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.jelechem.2008.02.002"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.7717\/peerj.4568"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ICARCV.2006.345381"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1007\/s11263-015-0816-y"},{"key":"ref27","first-page":"310","article-title":"Activation functions in neural networks","volume":"6","author":"sharma","year":"2017","journal-title":"Towards Data Sci"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/EIT.2019.8833768"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/eIT53891.2022.9813922"},{"journal-title":"Feature engineering on the cybersecurity dataset for deployment on software defined network","year":"2020","author":"rifat","key":"ref7"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/eIT53891.2022.9813777"},{"journal-title":"World malaria report 2022","year":"0","key":"ref4"},{"journal-title":"Cdc - malaria - malaria worldwide - impact of malaria","year":"2021","key":"ref3"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1371\/journal.pone.0104855"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1155\/2022\/7324281"}],"event":{"name":"2023 IEEE International Conference on Electro Information Technology (eIT)","start":{"date-parts":[[2023,5,18]]},"location":"Romeoville, IL, USA","end":{"date-parts":[[2023,5,20]]}},"container-title":["2023 IEEE International Conference on Electro Information Technology (eIT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10187212\/10187216\/10187342.pdf?arnumber=10187342","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,8,14]],"date-time":"2023-08-14T17:38:00Z","timestamp":1692034680000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10187342\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,5,18]]},"references-count":34,"URL":"https:\/\/doi.org\/10.1109\/eit57321.2023.10187342","relation":{},"subject":[],"published":{"date-parts":[[2023,5,18]]}}}