{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T16:16:02Z","timestamp":1730218562200,"version":"3.28.0"},"reference-count":2,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2014,1]]},"DOI":"10.1109\/elinfocom.2014.6914377","type":"proceedings-article","created":{"date-parts":[[2014,10,8]],"date-time":"2014-10-08T20:58:06Z","timestamp":1412801886000},"page":"1-2","source":"Crossref","is-referenced-by-count":0,"title":["Lifetime enhancement of NAND flash memory-based storage system by bad block reuse scheme"],"prefix":"10.1109","author":[{"given":"Taeyeong","family":"Huh","sequence":"first","affiliation":[]},{"given":"Farhan","family":"Hussain","sequence":"additional","affiliation":[]},{"given":"Sanghyuk","family":"Jung","sequence":"additional","affiliation":[]},{"given":"Yong Ho","family":"Song","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"2","first-page":"521","article-title":"Error patterns in MLC NAND flash memory: Measurement, characterization, and analysis","volume":"12","author":"cai","year":"2012","journal-title":"DATE"},{"journal-title":"Spartan-3 Generation FPGA User Guide","year":"2011","key":"1"}],"event":{"name":"2014 International Conference on Electronics, Information and Communications (ICEIC)","start":{"date-parts":[[2014,1,15]]},"location":"Kota Kinabalu, Sabah, Malaysia","end":{"date-parts":[[2014,1,18]]}},"container-title":["2014 International Conference on Electronics, Information and Communications (ICEIC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6899292\/6914344\/06914377.pdf?arnumber=6914377","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,23]],"date-time":"2017-03-23T19:22:18Z","timestamp":1490296938000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6914377\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,1]]},"references-count":2,"URL":"https:\/\/doi.org\/10.1109\/elinfocom.2014.6914377","relation":{},"subject":[],"published":{"date-parts":[[2014,1]]}}}