{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,3]],"date-time":"2024-09-03T18:13:27Z","timestamp":1725387207344},"reference-count":13,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,11]]},"DOI":"10.1109\/emccompo.2015.7358343","type":"proceedings-article","created":{"date-parts":[[2015,12,17]],"date-time":"2015-12-17T16:59:17Z","timestamp":1450371557000},"page":"125-130","source":"Crossref","is-referenced-by-count":3,"title":["Functional analysis of an integrated communication interface during ESD"],"prefix":"10.1109","author":[{"given":"Thomas","family":"Ungru","sequence":"first","affiliation":[]},{"given":"Wolfgang","family":"Wilkening","sequence":"additional","affiliation":[]},{"given":"Steffen","family":"Walker","sequence":"additional","affiliation":[]},{"given":"Renato","family":"Negra","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","first-page":"1","article-title":"Impact of the power supply on the ESD system level robustness","author":"giraldo","year":"2010","journal-title":"Proc EOS\/ESD Symp"},{"journal-title":"Road vehicles Controller area network (CAN) Part1 - Part 7 ISO11898","year":"2003","key":"ref11"},{"key":"ref12","first-page":"1","article-title":"The repeatability of system level ESD test and relevant ESD generator parameters","author":"koo","year":"2008","journal-title":"Proc IEEE Int Symp EMC"},{"key":"ref13","first-page":"101","article-title":"To what extent do contact-mode and indirect ESD test methods reproduce reality?","author":"pommerenke","year":"1995","journal-title":"Proc EOS\/ESD Symp"},{"journal-title":"Road vehicles - Test methods for electrical disturbances from electrostatic discharge ISO 10605","year":"2008","key":"ref4"},{"journal-title":"Electromagnetic compatibility (EMC) - Part 4–2 Testing and measurement techniques - Electrostatic discharge immunity test IEC 61000-4–2","year":"2008","key":"ref3"},{"journal-title":"ANSI\/ESD S5 2-2009 for Electrostatic Discharge Sensitivity Testing - Machine Model (MM) - Component Level","year":"0","key":"ref6"},{"journal-title":"ANSI\/ESDA\/JEDEC JS-001 'Electrostatic Discharge Sensitivity Testing – Human Body Model (HBM) – Component Level","year":"0","key":"ref5"},{"journal-title":"System Level ESD Part I Common Misconceptions and Recommended Basic Approaches White Paper 3 Industry Council on ESD Target Levels 2012","year":"0","key":"ref8"},{"journal-title":"ANSI\/ESD S5 3 1-2009 for Electrostatic Discharge Sensitivity Testing - Charged Device Model (CDM) - Component Level","year":"0","key":"ref7"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TEMC.2007.911911"},{"journal-title":"ESD Association 2013 Fundamentals of Electrostatic Discharge Part One An Introduction to ESD","year":"0","key":"ref1"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ISEMC.2007.162"}],"event":{"name":"2015 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)","start":{"date-parts":[[2015,11,10]]},"location":"Edinburgh, United Kingdom","end":{"date-parts":[[2015,11,13]]}},"container-title":["2015 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7352268\/7358224\/07358343.pdf?arnumber=7358343","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,24]],"date-time":"2017-03-24T21:44:30Z","timestamp":1490391870000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7358343\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,11]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/emccompo.2015.7358343","relation":{},"subject":[],"published":{"date-parts":[[2015,11]]}}}