{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T03:41:20Z","timestamp":1725507680732},"reference-count":6,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,11]]},"DOI":"10.1109\/emccompo.2015.7358365","type":"proceedings-article","created":{"date-parts":[[2015,12,17]],"date-time":"2015-12-17T16:59:17Z","timestamp":1450371557000},"page":"244-247","source":"Crossref","is-referenced-by-count":3,"title":["Smart power IC macromodeling for DPI analysis"],"prefix":"10.1109","author":[{"given":"H.","family":"Herrmann","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"W.","family":"Horchler","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S.","family":"Schwarz","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"P.","family":"Schroter","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"F.","family":"Klotz","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.","family":"Brignone","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"F.","family":"Fiori","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ASID.2011.5967445"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2013.2273123"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TEMC.2007.908255"},{"journal-title":"Ansys\ufffd Q3D Extractor","year":"2009","key":"ref5"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/EMCZUR.2007.4388200"},{"journal-title":"IEC 62132&#x2013;4 Integrated Circuits Measurement of Electromagnetic Immunity - Part 4 Direct RF Power Injection Method","year":"0","key":"ref1"}],"event":{"name":"2015 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)","start":{"date-parts":[[2015,11,10]]},"location":"Edinburgh, United Kingdom","end":{"date-parts":[[2015,11,13]]}},"container-title":["2015 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7352268\/7358224\/07358365.pdf?arnumber=7358365","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,24]],"date-time":"2017-03-24T22:03:33Z","timestamp":1490393013000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7358365\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,11]]},"references-count":6,"URL":"https:\/\/doi.org\/10.1109\/emccompo.2015.7358365","relation":{},"subject":[],"published":{"date-parts":[[2015,11]]}}}