{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,11,27]],"date-time":"2024-11-27T14:14:45Z","timestamp":1732716885557,"version":"3.28.2"},"reference-count":6,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,10,7]],"date-time":"2024-10-07T00:00:00Z","timestamp":1728259200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,10,7]],"date-time":"2024-10-07T00:00:00Z","timestamp":1728259200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,10,7]]},"DOI":"10.1109\/emccompo61192.2024.10742029","type":"proceedings-article","created":{"date-parts":[[2024,11,6]],"date-time":"2024-11-06T18:38:15Z","timestamp":1730918295000},"page":"42-45","source":"Crossref","is-referenced-by-count":0,"title":["Design and Application of RFIC Detector: To Measure Coupled Power into IC Pin via PCB Trace"],"prefix":"10.1109","author":[{"given":"Arunkumar H.","family":"Venkateshaiah","sequence":"first","affiliation":[{"name":"University of York,Department of Electronic Engineering,York,UK"}]},{"given":"John F.","family":"Dawson","sequence":"additional","affiliation":[{"name":"University of York,Department of Electronic Engineering,York,UK"}]},{"given":"Martin A.","family":"Trefzer","sequence":"additional","affiliation":[{"name":"University of York,Department of Electronic Engineering,York,UK"}]},{"given":"Simon J.","family":"Bale","sequence":"additional","affiliation":[{"name":"University of York,Department of Electronic Engineering,York,UK"}]},{"given":"Andrew C.","family":"Marvin","sequence":"additional","affiliation":[{"name":"University of York,Department of Electronic Engineering,York,UK"}]},{"given":"Martin P.","family":"Robinson","sequence":"additional","affiliation":[{"name":"University of York,Department of Electronic Engineering,York,UK"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TEMC.2019.2954303"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/EMCEUROPE48519.2020.9245804"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/EMC\/SI\/PI\/EMCEurope52599.2021.9559238"},{"volume-title":"Arduino Nano (V2.3) User Manual","year":"2008","key":"ref4"},{"volume-title":"VNA, ZVB20, Rohde & Schwarz","key":"ref5"},{"key":"ref6","article-title":"Prediction of Probability of IC Failure and Validation of Stochastic EM-Fields Coupling into PCB Traces using a Bespoke RF IC","author":"Venkateshaiah","year":"2024","journal-title":"IEEE Transactions on Electromagnetic Compatibility (under review)"}],"event":{"name":"2024 14th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)","start":{"date-parts":[[2024,10,7]]},"location":"Torino, Italy","end":{"date-parts":[[2024,10,9]]}},"container-title":["2024 14th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10741960\/10742012\/10742029.pdf?arnumber=10742029","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,11,27]],"date-time":"2024-11-27T13:06:48Z","timestamp":1732712808000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10742029\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,10,7]]},"references-count":6,"URL":"https:\/\/doi.org\/10.1109\/emccompo61192.2024.10742029","relation":{},"subject":[],"published":{"date-parts":[[2024,10,7]]}}}