{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T16:25:25Z","timestamp":1730219125965,"version":"3.28.0"},"reference-count":8,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2011,8]]},"DOI":"10.1109\/emeit.2011.6023700","type":"proceedings-article","created":{"date-parts":[[2011,10,12]],"date-time":"2011-10-12T16:24:52Z","timestamp":1318436692000},"page":"2869-2872","source":"Crossref","is-referenced-by-count":2,"title":["Application of SAGE algorithm to estimate thin layer material's thickness in ultrasonic NDE"],"prefix":"10.1109","author":[{"given":"Zhongzhu","family":"Liu","sequence":"first","affiliation":[]},{"given":"Chunguang","family":"Xu","sequence":"additional","affiliation":[]},{"given":"Bolong","family":"Men","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/58.920713"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/IWSSIP.2009.5367723"},{"key":"1","article-title":"Ultrasonic signal processing methods for detection of defects in composite materials","volume":"45","author":"pagodinas","year":"2002","journal-title":"Ultragarsas Journal"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/58.920714"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/78.324732"},{"journal-title":"A Genetic Algorithm-based Approach to Ultrasonic Echoes Estimation","year":"0","author":"zhongzhu","key":"5"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1016\/j.tafmec.2007.11.004"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1016\/S1359-8368(97)00007-3"}],"event":{"name":"Mechanical Engineering and Information Technology (EMEIT)","start":{"date-parts":[[2011,8,12]]},"location":"Harbin, Heilongjiang, China","end":{"date-parts":[[2011,8,14]]}},"container-title":["Proceedings of 2011 International Conference on Electronic & Mechanical Engineering and Information Technology"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5996364\/6023032\/06023700.pdf?arnumber=6023700","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T00:12:04Z","timestamp":1490055124000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6023700\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,8]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/emeit.2011.6023700","relation":{},"subject":[],"published":{"date-parts":[[2011,8]]}}}