{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,4]],"date-time":"2025-05-04T01:15:49Z","timestamp":1746321349000,"version":"3.37.3"},"reference-count":58,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,10,26]],"date-time":"2023-10-26T00:00:00Z","timestamp":1698278400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,10,26]],"date-time":"2023-10-26T00:00:00Z","timestamp":1698278400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,10,26]]},"DOI":"10.1109\/esem56168.2023.10304860","type":"proceedings-article","created":{"date-parts":[[2023,11,8]],"date-time":"2023-11-08T18:50:15Z","timestamp":1699469415000},"page":"1-9","source":"Crossref","is-referenced-by-count":2,"title":["The Vocabulary of Flaky Tests in the Context of SAP HANA"],"prefix":"10.1109","author":[{"ORCID":"https:\/\/orcid.org\/0009-0009-5248-6405","authenticated-orcid":false,"given":"Alexander","family":"Berndt","sequence":"first","affiliation":[{"name":"Karlsruhe University of Applied Sciences,Karlsruhe,Germany"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9146-8968","authenticated-orcid":false,"given":"Zolt\u00e1n","family":"Nochta","sequence":"additional","affiliation":[{"name":"Karlsruhe University of Applied Sciences,Karlsruhe,Germany"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9993-2814","authenticated-orcid":false,"given":"Thomas","family":"Bach","sequence":"additional","affiliation":[{"name":"SAP,Walldorf,Germany"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ISSRE5003.2020.00045"},{"journal-title":"Understanding Flaky Tests The Developer's Perspective","year":"2019","author":"eck","key":"ref57"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/s13222-022-00426-x"},{"key":"ref56","doi-asserted-by":"publisher","DOI":"10.1109\/ICSM.2015.7332456"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1007\/s10664-013-9290-8"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1145\/3379597.3387482"},{"key":"ref58","doi-asserted-by":"publisher","DOI":"10.1145\/3377811.3381749"},{"journal-title":"KFold Scikit-Learn Documentation","year":"2022","key":"ref53"},{"journal-title":"Dos and Don'ts of Machine Learning in Computer Security","year":"2020","author":"arp","key":"ref52"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2022.3208864"},{"journal-title":"SAP HANA Virtual Tables Documentation","year":"2022","key":"ref55"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1145\/3377813.3381370"},{"key":"ref54","doi-asserted-by":"publisher","DOI":"10.1109\/MSR52588.2021.00034"},{"journal-title":"DeFlaker Website","year":"2022","author":"bell","key":"ref17"},{"key":"ref16","article-title":"DeFlaker: Automatically Detecting Flaky Tests","author":"bell","year":"0","journal-title":"Proceedings of the 40th International Conference on Software Engineering"},{"key":"ref19","article-title":"TF-IDF","author":"sammut","year":"2010","journal-title":"Encyclopedia of Machine Learning"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1023\/A:1010933404324"},{"journal-title":"TF-IDFC-RF GitHub","year":"2022","key":"ref51"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1109\/ICPC52881.2021.00052"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1109\/SANER53432.2022.00130"},{"journal-title":"NLTK Documentation","year":"2022","key":"ref45"},{"key":"ref48","article-title":"Automatically Identifying Shared Root Causes of Test Breakages in SAP HANA","author":"an","year":"0","journal-title":"Proceedings of the 44th ICSE SEiP"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.21105\/joss.00653"},{"journal-title":"RandomUnderSampler Documentation","year":"2022","key":"ref42"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1007\/978-981-4585-18-7_2"},{"journal-title":"Token Documentation","year":"2022","key":"ref44"},{"journal-title":"Introduction to Information Retrieval","year":"2022","key":"ref43"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1109\/34.206958"},{"journal-title":"How do you test your tests?","year":"2022","key":"ref8"},{"journal-title":"Floky tests at google and how we mitigate them","year":"2022","key":"ref7"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/3476105"},{"journal-title":"Test flakiness- methods for identifying and dealing with flaky tests","year":"2022","author":"palmer","key":"ref4"},{"journal-title":"Where do our flaky tests come from?","year":"2020","author":"listfield","key":"ref3"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/3293882.3330570"},{"journal-title":"Handling Flaky Tests at Scale Auto Detection & Suppression","year":"2022","key":"ref5"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3082424"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1007\/s10462-004-0751-8"},{"journal-title":"Testing in Very Large Software Projects","year":"2020","author":"bach","key":"ref34"},{"journal-title":"Exploratory Data Analysis Feature Selection for Better ML Models","year":"2022","key":"ref37"},{"journal-title":"MSR4Flakiness","year":"2022","author":"pinto","key":"ref36"},{"journal-title":"What is SAP HANA?","year":"2022","key":"ref31"},{"key":"ref30","article-title":"FlakeFlagger: Predicting Flakiness Without Rerunning Tests","author":"alshammari","year":"0","journal-title":"2021 IEEE\/ACM 43rd International Conference on Software Engineering (ICSE)"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1145\/2094114.2094126"},{"key":"ref32","article-title":"The SAP HANA Database - An Architecture Overview","author":"f\u00e4rber","year":"2012","journal-title":"IEEE Data Eng Bull"},{"journal-title":"SWEBOK Guide to the Software Engineering Body of Knowledge","year":"2014","author":"bourque","key":"ref2"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1007\/s10664-022-10285-5"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1007\/s10670-021-00464-z"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1145\/2635868.2635920"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2019.04.015"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.ins.2013.02.029"},{"journal-title":"TF-IDFC-RF A Novel Supervised Term Weighting Scheme","year":"2020","author":"carvalho","key":"ref26"},{"key":"ref25","article-title":"Delta TF-IDF: An Improved Feature Space for Sentiment Analysis","author":"martineau","year":"0","journal-title":"Proceedings of the International AAAI Conference on Web and Social Media"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2016.09.009"},{"journal-title":"Supervised and Traditional Term Weighting Methods for Automatie Text Categorization","year":"2009","author":"lan","key":"ref22"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1145\/952686.952688"},{"journal-title":"Flakify A Black-Box Language Model-based Predictor for Flaky Tests","year":"2021","author":"fatima","key":"ref28"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1145\/2939672.2939785"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.18653\/v1\/2020.findings-emnlp.139"}],"event":{"name":"2023 ACM\/IEEE International Symposium on Empirical Software Engineering and Measurement (ESEM)","start":{"date-parts":[[2023,10,26]]},"location":"New Orleans, LA, USA","end":{"date-parts":[[2023,10,27]]}},"container-title":["2023 ACM\/IEEE International Symposium on Empirical Software Engineering and Measurement (ESEM)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10304838\/10304789\/10304860.pdf?arnumber=10304860","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,12,11]],"date-time":"2023-12-11T19:19:20Z","timestamp":1702322360000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10304860\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,10,26]]},"references-count":58,"URL":"https:\/\/doi.org\/10.1109\/esem56168.2023.10304860","relation":{},"subject":[],"published":{"date-parts":[[2023,10,26]]}}}