{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T02:27:48Z","timestamp":1750213668611,"version":"3.28.0"},"reference-count":10,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2007,9]]},"DOI":"10.1109\/esscirc.2007.4430259","type":"proceedings-article","created":{"date-parts":[[2008,1,14]],"date-time":"2008-01-14T18:19:25Z","timestamp":1200334765000},"page":"115-118","source":"Crossref","is-referenced-by-count":7,"title":["Impact of well edge proximity effect on timing"],"prefix":"10.1109","author":[{"family":"Toshiki Kanamoto","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Yasuhiro Ogasahara","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Keiko Natsume","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Kenji Yamaguchi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Hiroyuki Amishiro","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Tetsuya Watanabe","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Masanori Hashimoto","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"3","DOI":"10.1109\/CICC.2005.1568798"},{"key":"2","doi-asserted-by":"crossref","first-page":"193","DOI":"10.1109\/ISSM.2005.1513333","article-title":"CMOS Vt-control improvement through implant lateral scatter elimination","author":"polishchuk","year":"2005","journal-title":"Proc 2005 IEEE Int Symp Semiconduct Manufact"},{"doi-asserted-by":"publisher","key":"10","DOI":"10.1093\/ietele\/e89-c.3.342"},{"doi-asserted-by":"publisher","key":"1","DOI":"10.1109\/TED.2003.815371"},{"doi-asserted-by":"publisher","key":"7","DOI":"10.1109\/TED.2006.880176"},{"year":"0","journal-title":"Guidelines for Extracting Well Proximity Effect Instance Parameters","key":"6"},{"year":"2005","journal-title":"BSIM4 5 0 Complete Manual","key":"5"},{"key":"4","first-page":"89","article-title":"Path-based timing optimization by buffer insertion with accurate delay model","volume":"1","author":"zhang","year":"2003","journal-title":"Proc 5th Int Conf ASIC"},{"year":"0","journal-title":"Library Compiler Version 2000 05 User Guide","key":"9"},{"year":"0","key":"8"}],"event":{"name":"ESSCIRC 2007 - 33rd European Solid-State Circuits Conference","start":{"date-parts":[[2007,9,11]]},"location":"Muenchen, Germany","end":{"date-parts":[[2007,9,13]]}},"container-title":["ESSCIRC 2007 - 33rd European Solid-State Circuits Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4430236\/4430237\/04430259.pdf?arnumber=4430259","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,17]],"date-time":"2017-06-17T23:00:54Z","timestamp":1497740454000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4430259\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2007,9]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/esscirc.2007.4430259","relation":{},"ISSN":["1930-8833"],"issn-type":[{"type":"print","value":"1930-8833"}],"subject":[],"published":{"date-parts":[[2007,9]]}}}