{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,29]],"date-time":"2025-11-29T16:11:02Z","timestamp":1764432662867},"reference-count":4,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2008,9]]},"DOI":"10.1109\/esscirc.2008.4681834","type":"proceedings-article","created":{"date-parts":[[2008,11,25]],"date-time":"2008-11-25T21:23:25Z","timestamp":1227648205000},"page":"230-233","source":"Crossref","is-referenced-by-count":54,"title":["Importance sampling Monte Carlo simulations for accurate estimation of SRAM yield"],"prefix":"10.1109","author":[{"given":"T.S.","family":"Doorn","sequence":"first","affiliation":[]},{"given":"E.J.W.","family":"ter Maten","sequence":"additional","affiliation":[]},{"given":"J.A.","family":"Croon","sequence":"additional","affiliation":[]},{"given":"A.","family":"Di Bucchianico","sequence":"additional","affiliation":[]},{"given":"O.","family":"Wittich","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1145\/1146909.1146930"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIT.2007.4339733"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2006.873215"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1987.1052809"}],"event":{"name":"ESSCIRC 2008 - 34th European Solid-State Circuits Conference","start":{"date-parts":[[2008,9,15]]},"location":"Edinburgh, UK","end":{"date-parts":[[2008,9,19]]}},"container-title":["ESSCIRC 2008 - 34th European Solid-State Circuits Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4669531\/4681770\/04681834.pdf?arnumber=4681834","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,17]],"date-time":"2017-03-17T19:26:37Z","timestamp":1489778797000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4681834\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,9]]},"references-count":4,"URL":"https:\/\/doi.org\/10.1109\/esscirc.2008.4681834","relation":{},"subject":[],"published":{"date-parts":[[2008,9]]}}}