{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,29]],"date-time":"2025-05-29T01:50:43Z","timestamp":1748483443320,"version":"3.28.0"},"reference-count":15,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2012,9]]},"DOI":"10.1109\/esscirc.2012.6341253","type":"proceedings-article","created":{"date-parts":[[2012,11,15]],"date-time":"2012-11-15T17:07:41Z","timestamp":1352999261000},"page":"46-52","source":"Crossref","is-referenced-by-count":1,"title":["Advancements on reliability-aware analog circuit design"],"prefix":"10.1109","author":[{"given":"B.","family":"Ardouin","sequence":"first","affiliation":[]},{"given":"J.-Y.","family":"Dupuy","sequence":"additional","affiliation":[]},{"given":"J.","family":"Godin","sequence":"additional","affiliation":[]},{"given":"V.","family":"Nodjiadjim","sequence":"additional","affiliation":[]},{"given":"M.","family":"Riet","sequence":"additional","affiliation":[]},{"given":"F.","family":"Marc","sequence":"additional","affiliation":[]},{"given":"G. A.","family":"Kone","sequence":"additional","affiliation":[]},{"given":"S.","family":"Ghosh","sequence":"additional","affiliation":[]},{"given":"B.","family":"Grandchamp","sequence":"additional","affiliation":[]},{"given":"C.","family":"Maneux","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"15","first-page":"25","article-title":"Modeling and parameter extraction of SiGe: C HBT's with HICUM for the emerging terahertz era","author":"ardouin","year":"2010","journal-title":"Proceeding of the Microwave Integrated Circuits Conference (EuMIC"},{"key":"13","doi-asserted-by":"crossref","first-page":"1730","DOI":"10.1016\/j.microrel.2011.07.073","article-title":"Reliability on submicron InP\/InGaAs DHBT on accelerated aging tests under thermal and electrical stresses","volume":"51","author":"kone?","year":"2011","journal-title":"Microelectronics Reliability"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2005.862246"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/ICSICT.2004.1436675"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1063\/1.339713"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2006.879117"},{"key":"2","first-page":"157","article-title":"PRESS-A reliability circuit simulator with built-in hot carrier degradation model","author":"lunenborg","year":"1993","journal-title":"Conf proc ESREF"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/4.121544"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1016\/j.sse.2005.03.007"},{"year":"0","key":"7"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/CSICS.2008.28"},{"key":"5","first-page":"341","article-title":"P DHBT transimpedance amplifiers with automatic offset compensation for 100 Gbit\/s optical communications","author":"dupuy","year":"2010","journal-title":"Proc of the Microwave Integrated Circuits Conference (EuMIC) 2010 European"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1093\/ietele\/e88-c.6.1098"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1016\/j.sse.2007.04.011"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1016\/S0026-2692(00)00106-3"}],"event":{"name":"ESSCIRC 2012 - 38th European Solid State Circuits Conference","start":{"date-parts":[[2012,9,17]]},"location":"Bordeaux, France","end":{"date-parts":[[2012,9,21]]}},"container-title":["2012 Proceedings of the ESSCIRC (ESSCIRC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6331297\/6341242\/06341253.pdf?arnumber=6341253","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,21]],"date-time":"2017-06-21T02:43:13Z","timestamp":1498012993000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6341253\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,9]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/esscirc.2012.6341253","relation":{},"subject":[],"published":{"date-parts":[[2012,9]]}}}