{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T20:17:53Z","timestamp":1729628273210,"version":"3.28.0"},"reference-count":12,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,9]]},"DOI":"10.1109\/esscirc.2013.6649164","type":"proceedings-article","created":{"date-parts":[[2013,11,1]],"date-time":"2013-11-01T20:39:33Z","timestamp":1383338373000},"page":"427-430","source":"Crossref","is-referenced-by-count":9,"title":["High temperature-low temperature coefficient analog voltage reference integrated circuit implemented with SiC MESFETs"],"prefix":"10.1109","author":[{"given":"Viorel","family":"Banu","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Philippe","family":"Godignon","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mihaela","family":"Alexandru","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Miquel","family":"Vellvehi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xavier","family":"Jorda","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jose","family":"Millan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.4028\/www.scientific.net\/MSF.740-742.1048"},{"key":"2","doi-asserted-by":"crossref","first-page":"754","DOI":"10.4028\/www.scientific.net\/MSF.679-680.754","article-title":"Study of feasisibility of sic bandgap voltage reference for high temperature applications","volume":"679 680","author":"banu","year":"2011","journal-title":"Materials Science Forum"},{"key":"10","first-page":"2281","article-title":"A Novel Low Voltage Subtracting BandGap Reference with Temperature Coefficient of 2. 2 ppm\/C","author":"zhu","year":"0","journal-title":"2011 IEEE International Symposium on Circuits and Systems (ISCAS)"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.4028\/www.scientific.net\/MSF.645-648.1131"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/95.536843"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.4028\/www.scientific.net\/MSF.711.104"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/SMICND.2011.6095803"},{"journal-title":"Design of Logic Gates for High Temperature and Harsh Radiation Environment made of 4H-SiC MESFET Proc of the 33rd International Semiconductor Conference (CAS 2010","year":"0","author":"alexandru","key":"4"},{"key":"9","doi-asserted-by":"crossref","first-page":"735","DOI":"10.4028\/www.scientific.net\/MSF.353-356.735","volume":"353 356","author":"vassilevsky","year":"2001","journal-title":"Mater Sci Forum"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/ISPSD.2007.4294986"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2010.2080252"},{"key":"12","article-title":"Long Term Stability of Packaged SiC Schottky Diodes in the-170C\/+280C Temperature Range","author":"godignon","year":"2010","journal-title":"Proceedings of the 19th International Symposium on Power Semiconductor Devices and IC's ISPSD"}],"event":{"name":"ESSCIRC 2013 - 39th European Solid State Circuits Conference","start":{"date-parts":[[2013,9,16]]},"location":"Bucharest, Romania","end":{"date-parts":[[2013,9,20]]}},"container-title":["2013 Proceedings of the ESSCIRC (ESSCIRC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6641026\/6649054\/06649164.pdf?arnumber=6649164","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,10,14]],"date-time":"2020-10-14T11:24:29Z","timestamp":1602674669000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/6649164"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,9]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/esscirc.2013.6649164","relation":{},"subject":[],"published":{"date-parts":[[2013,9]]}}}