{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,27]],"date-time":"2025-10-27T10:49:24Z","timestamp":1761562164441,"version":"3.28.0"},"reference-count":19,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,9]]},"DOI":"10.1109\/esscirc.2016.7598293","type":"proceedings-article","created":{"date-parts":[[2016,10,20]],"date-time":"2016-10-20T17:07:39Z","timestamp":1476983259000},"page":"265-268","source":"Crossref","is-referenced-by-count":4,"title":["FEOL\/BEOL wear-out estimator using stress-to-frequency conversion of voltage\/temperature-sensitive ring oscillators for 28nm automotive MCUs"],"prefix":"10.1109","author":[{"given":"Kan","family":"Takeuchi","sequence":"first","affiliation":[]},{"given":"Masaki","family":"Shimada","sequence":"additional","affiliation":[]},{"given":"Takeshi","family":"Okagaki","sequence":"additional","affiliation":[]},{"given":"Koji","family":"Shibutani","sequence":"additional","affiliation":[]},{"given":"Koji","family":"Nii","sequence":"additional","affiliation":[]},{"given":"Fumio","family":"Tsuchiya","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2015.7112758"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2010.2067810"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ESSCIRC.2015.7313841"},{"key":"ref13","article-title":"Early Detection of Oxide Breakdown Through In Situ Degaradation Sensing","volume":"9","author":"singh","year":"2010","journal-title":"ISSCC"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2010.2040125"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2013.6653596"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2016.7417913"},{"key":"ref17","first-page":"5c3","article-title":"Impact of VLSI Technology Scaling on HTOL","author":"kwasnick","year":"2016","journal-title":"IRPS"},{"key":"ref18","first-page":"152","article-title":"A 1.1V $35\\text{um} \\times 35\\text{um}$ thermal sensor with supply voltage sensitivity of 2C\/10%-supply for thermal management on the SX-9 supercomputer","author":"saneyoshi","year":"2008","journal-title":"Symp on VLSI Circuits"},{"key":"ref19","article-title":"CMOS FEOL Reliability in Advanced Nodes — A Foundry Perspective","author":"parameshwaran","year":"2014","journal-title":"IRPS tutorial Topic 1 4"},{"key":"ref4","article-title":"Fast Characterization of PBTI and NBTI Induced Frequency Shifts under a Realisitc Recovery Bias Using a Ring Oscillator Based Circuit","volume":"6b","author":"wang","year":"2014","journal-title":"IRPS"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2012.6241868"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2015.7112756"},{"key":"ref5","article-title":"Aging Sensors for Workload Centric Guardbanding in Dynamic Voltage Scaling Applications","volume":"4a","author":"chen","year":"2013","journal-title":"IRPS"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2011.5783784"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2015.7112757"},{"key":"ref2","article-title":"BEOL reliability challenges and its interaction with process integration","author":"aubel","year":"2011","journal-title":"IRPS tutorial Topic 134"},{"key":"ref1","first-page":"80t","article-title":"Automotive Low Power Technology for IoT Society","author":"yamauchi","year":"2015","journal-title":"Symp on VLSI Tech"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2014.6860598"}],"event":{"name":"ESSCIRC Conference 2016: 42nd European Solid-State Circuits Conference","start":{"date-parts":[[2016,9,12]]},"location":"Lausanne, Switzerland","end":{"date-parts":[[2016,9,15]]}},"container-title":["ESSCIRC Conference 2016: 42nd European Solid-State Circuits Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7585490\/7598228\/07598293.pdf?arnumber=7598293","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2016,11,16]],"date-time":"2016-11-16T09:33:27Z","timestamp":1479288807000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7598293\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,9]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/esscirc.2016.7598293","relation":{},"subject":[],"published":{"date-parts":[[2016,9]]}}}