{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T07:28:02Z","timestamp":1725780482185},"reference-count":8,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,9]]},"DOI":"10.1109\/esscirc.2017.8094556","type":"proceedings-article","created":{"date-parts":[[2017,11,28]],"date-time":"2017-11-28T11:03:53Z","timestamp":1511867033000},"page":"183-186","source":"Crossref","is-referenced-by-count":2,"title":["Background calibration using noisy reference ADC for a 12 b 600 MS\/s 2 \u00d7 TI SAR ADC in 14nm CMOS FinFET"],"prefix":"10.1109","author":[{"given":"Danny","family":"Luu","sequence":"first","affiliation":[]},{"given":"Lukas","family":"Kull","sequence":"additional","affiliation":[]},{"given":"Thomas","family":"Toifl","sequence":"additional","affiliation":[]},{"given":"Christian","family":"Menolfi","sequence":"additional","affiliation":[]},{"given":"Matthias","family":"Braendli","sequence":"additional","affiliation":[]},{"given":"Pier Andrea","family":"Francese","sequence":"additional","affiliation":[]},{"given":"Thomas","family":"Morf","sequence":"additional","affiliation":[]},{"given":"Marcel","family":"Kossel","sequence":"additional","affiliation":[]},{"given":"Hazar","family":"Yueksel","sequence":"additional","affiliation":[]},{"given":"Alessandro","family":"Cevrero","sequence":"additional","affiliation":[]},{"given":"Ilter","family":"Ozkaya","sequence":"additional","affiliation":[]},{"given":"Qiuting","family":"Huang","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","article-title":"An 8-bit 1.25 GS\/s CMOS IF-sampling ADC with background calibration for dynamic distortion","author":"chen","year":"2016","journal-title":"2016 IEEE A-SSCC"},{"key":"ref3","article-title":"A 8.2-mW 10-b 1.6-GS\/s 4x TI SAR ADC with fast reference charge neutralization and background timing-skew calibration in 16-nm CMOS","author":"lin","year":"2016","journal-title":"2016 Symposium on VLSI Circuits"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1109\/TCSII.2010.2042131"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.23919\/VLSIC.2017.8008506"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1109\/ISSCC.2014.6757481"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1109\/JSSC.2003.819167"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1109\/TCSI.2011.2177005"},{"year":"0","author":"murmann","journal-title":"ADC Performance Survey 1997–2013","key":"ref1"}],"event":{"name":"ESSCIRC 2017 - 43rd IEEE European Solid-State Circuits Conference","start":{"date-parts":[[2017,9,11]]},"location":"Leuven","end":{"date-parts":[[2017,9,14]]}},"container-title":["ESSCIRC 2017 - 43rd IEEE European Solid State Circuits Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8061155\/8094509\/08094556.pdf?arnumber=8094556","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,4,25]],"date-time":"2019-04-25T23:25:38Z","timestamp":1556234738000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8094556\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,9]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/esscirc.2017.8094556","relation":{},"subject":[],"published":{"date-parts":[[2017,9]]}}}