{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,25]],"date-time":"2026-01-25T05:01:48Z","timestamp":1769317308599,"version":"3.49.0"},"reference-count":8,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,9]]},"DOI":"10.1109\/esscirc.2018.8494332","type":"proceedings-article","created":{"date-parts":[[2018,12,7]],"date-time":"2018-12-07T21:18:18Z","timestamp":1544217498000},"page":"82-85","source":"Crossref","is-referenced-by-count":17,"title":["A 0.5 V, 650 pW, 0.031%\/V Line Regulation Subthreshold Voltage Reference"],"prefix":"10.1109","author":[{"given":"Yuwei","family":"Wang","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ruizhi","family":"Zhang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Quan","family":"Sun","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hong","family":"Zhang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2010.2092997"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2017.2754644"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2016.2576643"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2014.2345298"},{"key":"ref8","author":"tsividis","year":"1999","journal-title":"Operation and Modeling of the MOS Transistor"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2016.7573494"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2014.2361766"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2017.2654441"}],"event":{"name":"ESSCIRC 2018 - IEEE 44th European Solid State Circuits Conference (ESSCIRC)","location":"Dresden","start":{"date-parts":[[2018,9,3]]},"end":{"date-parts":[[2018,9,6]]}},"container-title":["ESSCIRC 2018 - IEEE 44th European Solid State Circuits Conference (ESSCIRC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8476980\/8494227\/08494332.pdf?arnumber=8494332","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,8,24]],"date-time":"2020-08-24T01:36:10Z","timestamp":1598232970000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8494332\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,9]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/esscirc.2018.8494332","relation":{},"subject":[],"published":{"date-parts":[[2018,9]]}}}