{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T16:52:30Z","timestamp":1725727950879},"reference-count":11,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,9,1]],"date-time":"2019-09-01T00:00:00Z","timestamp":1567296000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,9,1]],"date-time":"2019-09-01T00:00:00Z","timestamp":1567296000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,9,1]],"date-time":"2019-09-01T00:00:00Z","timestamp":1567296000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,9]]},"DOI":"10.1109\/esscirc.2019.8902928","type":"proceedings-article","created":{"date-parts":[[2019,11,25]],"date-time":"2019-11-25T19:29:08Z","timestamp":1574710148000},"page":"63-66","source":"Crossref","is-referenced-by-count":3,"title":["A No-Trim, Scaling-Friendly Thermal Sensor in 16nm FinFET Using Bulk Diodes as Sensing Elements"],"prefix":"10.1109","author":[{"given":"M.","family":"Eberlein","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"H.","family":"Pretl","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2015.2396522"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2018.8310312"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1119\/1.1578070"},{"key":"ref6","first-page":"1","article-title":"A 30.1?m2, < &#x00B1;1.1&#x00B0;C-3?-error, 0.4-to-1.0V temperature sensor based on direct threshold-voltage sensing for on-chip dense thermal monitoring","author":"kim","year":"2015","journal-title":"In Proc IEEE CICC"},{"key":"ref11","first-page":"99","article-title":"A 40nW, sub-1V truly &#x2018;digital&#x2019; reverse bandgap reference using bulk-diodes in 16nm FinFET","author":"eberlein","year":"2018","journal-title":"Proc IEEE A-SSCC"},{"key":"ref5","first-page":"271","article-title":"A temperature sensor with a 3 sigma inaccuracy of &#x00B1;2&#x00B0;C without trimming from ?50&#x00B0;C to 150&#x00B0;C in a 16nm FinFET process","author":"chuang","year":"2015","journal-title":"Proc ESSCIRC"},{"key":"ref8","first-page":"184","article-title":"A 0.12mm2 Wien&#x2013;Bridge temperature sensor with 0.1&#x00B0;C (3?) inaccuracy from ?40&#x00B0;C to 180&#x00B0;C","author":"pan","year":"2019","journal-title":"Digest ISSCC"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2014.6858376"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2016.7573532"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ESSDERC.2018.8486902"},{"key":"ref1","first-page":"206","article-title":"1650?m2 thermal-diffusivity sensors with inaccuracies down to &#x00B1;0.75&#x00B0;C in 40nm CMOS","author":"s\u00f6nmez","year":"2016","journal-title":"Digest ISSCC"}],"event":{"name":"ESSCIRC 2019 - IEEE 45th European Solid State Circuits Conference (ESSCIRC)","start":{"date-parts":[[2019,9,23]]},"location":"Cracow, Poland","end":{"date-parts":[[2019,9,26]]}},"container-title":["ESSCIRC 2019 - IEEE 45th European Solid State Circuits Conference (ESSCIRC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8895615\/8902346\/08902928.pdf?arnumber=8902928","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,15]],"date-time":"2022-07-15T03:09:34Z","timestamp":1657854574000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8902928\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,9]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/esscirc.2019.8902928","relation":{},"subject":[],"published":{"date-parts":[[2019,9]]}}}