{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T17:53:48Z","timestamp":1725731628358},"reference-count":10,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,9,13]],"date-time":"2021-09-13T00:00:00Z","timestamp":1631491200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,9,13]],"date-time":"2021-09-13T00:00:00Z","timestamp":1631491200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,9,13]],"date-time":"2021-09-13T00:00:00Z","timestamp":1631491200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,9,13]]},"DOI":"10.1109\/esscirc53450.2021.9567766","type":"proceedings-article","created":{"date-parts":[[2021,10,26]],"date-time":"2021-10-26T21:10:54Z","timestamp":1635282654000},"page":"115-118","source":"Crossref","is-referenced-by-count":2,"title":["A Calibration-Free In-Memory True Random Number Generator Using Voltage-Controlled MRAM"],"prefix":"10.1109","author":[{"given":"Jiyue","family":"Yang","sequence":"first","affiliation":[]},{"given":"Di","family":"Wu","sequence":"additional","affiliation":[]},{"given":"Albert","family":"Lee","sequence":"additional","affiliation":[]},{"given":"Seyed Armin","family":"Razavi","sequence":"additional","affiliation":[]},{"given":"Puneet","family":"Gupta","sequence":"additional","affiliation":[]},{"given":"Kang L.","family":"Wang","sequence":"additional","affiliation":[]},{"given":"Sudhakar","family":"Pamarti","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","first-page":"216","article-title":"A true random number generator using time-dependent dielectric breakdown","author":"liu","year":"0","journal-title":"2011 Symposium on VLSI Circuits Digest of Technical Papers"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2519383"},{"journal-title":"IEEE Transactions on Acoustics Speech and Signal Processing","year":"0","author":"gupta","key":"ref10"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2018.8502431"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2014.7047039"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2018.8614637"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2012.6479130"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2012.2217631"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1063\/1.4959593"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1038\/nature23461"}],"event":{"name":"ESSCIRC 2021 - IEEE 47th European Solid State Circuits Conference (ESSCIRC)","start":{"date-parts":[[2021,9,13]]},"location":"Grenoble, France","end":{"date-parts":[[2021,9,22]]}},"container-title":["ESSCIRC 2021 - IEEE 47th European Solid State Circuits Conference (ESSCIRC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9567713\/9567736\/09567766.pdf?arnumber=9567766","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T16:53:21Z","timestamp":1652201601000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9567766\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,9,13]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/esscirc53450.2021.9567766","relation":{},"subject":[],"published":{"date-parts":[[2021,9,13]]}}}