{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,31]],"date-time":"2026-01-31T06:23:02Z","timestamp":1769840582080,"version":"3.49.0"},"reference-count":8,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,9,19]],"date-time":"2022-09-19T00:00:00Z","timestamp":1663545600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,9,19]],"date-time":"2022-09-19T00:00:00Z","timestamp":1663545600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,9,19]]},"DOI":"10.1109\/esscirc55480.2022.9911331","type":"proceedings-article","created":{"date-parts":[[2022,11,3]],"date-time":"2022-11-03T21:58:34Z","timestamp":1667512714000},"page":"517-520","source":"Crossref","is-referenced-by-count":3,"title":["A 183F<sup>2<\/sup> Gate Leakage-Based Physically Unclonable Function With Area Efficient Current Tilting-Based Masking Scheme"],"prefix":"10.1109","author":[{"given":"Beomsoo","family":"Park","sequence":"first","affiliation":[{"name":"Univesity of Florida,Department of Electrical and Computer Engineering,Gainesville,FL,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Nima","family":"Maghari","sequence":"additional","affiliation":[{"name":"Univesity of Florida,Department of Electrical and Computer Engineering,Gainesville,FL,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2012.2206683"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42613.2021.9365741"},{"key":"ref4","first-page":"132","article-title":"A 445F2 leakage-based physically unclonable function with lossless stabilization through remapping for loT security","author":"lee","year":"2018","journal-title":"IEEE ISSCC Dig Tech Papers"},{"key":"ref3","first-page":"426","article-title":"Physically unclonable function in 28nm fdsoi technology achieving high reliability for aec-q 100 grade 1 and iso 26262 asil-b","author":"choi","year":"2020","journal-title":"IEEE ISSCC Dig Tech Papers"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2020.2996772"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2963002"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1002\/sdtp.13506"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2865584"}],"event":{"name":"ESSCIRC 2022- IEEE 48th European Solid State Circuits Conference (ESSCIRC)","location":"Milan, Italy","start":{"date-parts":[[2022,9,19]]},"end":{"date-parts":[[2022,9,22]]}},"container-title":["ESSCIRC 2022- IEEE 48th European Solid State Circuits Conference (ESSCIRC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9911257\/9911222\/09911331.pdf?arnumber=9911331","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,5,16]],"date-time":"2023-05-16T15:38:28Z","timestamp":1684251508000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9911331\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,9,19]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/esscirc55480.2022.9911331","relation":{},"subject":[],"published":{"date-parts":[[2022,9,19]]}}}